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Volumn , Issue , 2010, Pages 382-387

Low-cost, customized and flexible SRAM MBIST engine

Author keywords

[No Author keywords available]

Indexed keywords

8051 MICROCONTROLLERS; DESIGN TIME; ENGINEERING ASPECTS; ORTHOGONALITY; TEST ENGINEERING;

EID: 77954947519     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/DDECS.2010.5491749     Document Type: Conference Paper
Times cited : (9)

References (15)
  • 5
    • 33747875788 scopus 로고    scopus 로고
    • ADOFs and resistive-ADOFs in SRAM address decoders: Test conditions and march solutions
    • Springer June
    • L. Dilillo, et. al, 'ADOFs and Resistive-ADOFs in SRAM Address Decoders: Test Conditions and March Solutions', JETTA Journal of Electronic Testing - Theory and Applications, Springer, Vol. 22, N 3, pp. 287-296, June 2006.
    • (2006) JETTA Journal of Electronic Testing - Theory and Applications , vol.22 , Issue.3 , pp. 287-296
    • Dilillo, L.1
  • 6
    • 0003028893 scopus 로고    scopus 로고
    • High volume microprocessor test escapes: An analysis of defects our tests are missing
    • W.M. Needham, C. Prunty, and Y. E. Hong, 'High Volume Microprocessor Test Escapes: an analysis of defects our tests are missing"', Proc. of Int. Test Conference, pp. 2534, 1998.
    • (1998) Proc. of Int. Test Conference , pp. 2534
    • Needham, W.M.1    Prunty, C.2    Hong, Y.E.3
  • 9
    • 0036566125 scopus 로고    scopus 로고
    • Efficient tests for realistic faults in dual-port memories
    • May
    • S. Hamdioui and A. van de Goor, 'Efficient Tests for Realistic Faults in Dual-Port Memories', IEEE transaction on Computers, pp. 460-473, May 2002.
    • (2002) IEEE Transaction on Computers , pp. 460-473
    • Hamdioui, S.1    Van De Goor, A.2
  • 12


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.