-
1
-
-
33847096745
-
Full-speed field-programmable memory BIST architecture
-
X. Du, N. Mukherjee, W.T Cheng and S.M Reddy, 'Full-speed field-programmable memory BIST architecture', Proc. of Int. Test Conference, pp. 1173-1182, 2005.
-
(2005)
Proc. of Int. Test Conference
, pp. 1173-1182
-
-
Du, X.1
Mukherjee, N.2
Cheng, W.T.3
Reddy, S.M.4
-
2
-
-
77954896774
-
March element based BIST
-
W. M. Zarrineh, C. Prunty, and Y. E. Hong, 'March Element Based BIST', Proc. of Int. Test Conference, 25-34, 1998.
-
(1998)
Proc. of Int. Test Conference
, pp. 25-34
-
-
Zarrineh, W.M.1
Prunty, C.2
Hong, Y.E.3
-
3
-
-
33847162467
-
A practical perspective on reducing ASIC NTFs
-
Conroy, Z. and Richmond, G. and Xinli Gu and Eklow, B, 'A practical perspective on reducing ASIC NTFs', Proc. of Int. Test Conference, pp. 349, 2005.
-
(2005)
Proc. of Int. Test Conference
, pp. 349
-
-
Conroy, Z.1
Richmond, G.2
Gu, X.3
Eklow, B.4
-
4
-
-
33847173268
-
Chasing subtle embedded RAM defects for nanometer technologies
-
Powell, T. and Kumar, A. Rayhawk, J. and Mukherjee, N, 'Chasing subtle embedded RAM defects for nanometer technologies', Proc. of Int. Test Conference, pp. 860, 2005.
-
(2005)
Proc. of Int. Test Conference
, pp. 860
-
-
Powell, T.1
Kumar, A.2
Rayhawk, J.3
Mukherjee, N.4
-
5
-
-
33747875788
-
ADOFs and resistive-ADOFs in SRAM address decoders: Test conditions and march solutions
-
Springer June
-
L. Dilillo, et. al, 'ADOFs and Resistive-ADOFs in SRAM Address Decoders: Test Conditions and March Solutions', JETTA Journal of Electronic Testing - Theory and Applications, Springer, Vol. 22, N 3, pp. 287-296, June 2006.
-
(2006)
JETTA Journal of Electronic Testing - Theory and Applications
, vol.22
, Issue.3
, pp. 287-296
-
-
Dilillo, L.1
-
6
-
-
0003028893
-
High volume microprocessor test escapes: An analysis of defects our tests are missing
-
W.M. Needham, C. Prunty, and Y. E. Hong, 'High Volume Microprocessor Test Escapes: an analysis of defects our tests are missing"', Proc. of Int. Test Conference, pp. 2534, 1998.
-
(1998)
Proc. of Int. Test Conference
, pp. 2534
-
-
Needham, W.M.1
Prunty, C.2
Hong, Y.E.3
-
9
-
-
0036566125
-
Efficient tests for realistic faults in dual-port memories
-
May
-
S. Hamdioui and A. van de Goor, 'Efficient Tests for Realistic Faults in Dual-Port Memories', IEEE transaction on Computers, pp. 460-473, May 2002.
-
(2002)
IEEE Transaction on Computers
, pp. 460-473
-
-
Hamdioui, S.1
Van De Goor, A.2
-
13
-
-
39749149612
-
Embedded memory field returns - Trials and tribulations
-
Khare, J.B. and Shah, A.B. and Raman, A. and Rayas, G. 'Embedded Memory Field Returns - Trials and Tribulations', Proc. of Int. Test Conference, pp. 1-6, 2006.
-
(2006)
Proc. of Int. Test Conference
, pp. 1-6
-
-
Khare, J.B.1
Shah, A.B.2
Raman, A.3
Rayas, G.4
-
14
-
-
0031169382
-
March U: A test for unlinked memory faults
-
June
-
A. van de Goor and G. N. Gaydadjiev, 'March U: A Test for Unlinked Memory Faults', IEE Proceedings on Circuits, Devices and Systems, Vol. 144, Issue 3, pp. 155-160, June 1997.
-
(1997)
IEE Proceedings on Circuits, Devices and Systems
, vol.144
, Issue.3
, pp. 155-160
-
-
Van De Goor, A.1
Gaydadjiev, G.N.2
-
15
-
-
0029712826
-
March LR: A test for realistic linked faults
-
April
-
A. van de Goor, G. N. Gaydadjiev, V. N. Yarmolik, and V. Mikitjuk, 'March LR: A Test for Realistic Linked Faults', Proc. of IEEE VLSI Test Symposium, pp. 272-280, April 1996.
-
(1996)
Proc. of IEEE VLSI Test Symposium
, pp. 272-280
-
-
Van De, A.1
Goor, G.N.2
Yarmolik, G.V.N.3
Mikitjuk, V.4
|