March LR: a test for realistic linked faults

Proceedings of the IEEE VLSI Test Symposium

Volumn , Issue , 1996, Pages 272-280

  van de Goor, A J ^a   Gaydadjiev, G N ^a   Yarmolik, V N ^a   Mikitjuk, V G ^a  

^a DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

DECODING; ERROR DETECTION; FAILURE ANALYSIS; MATHEMATICAL MODELS; SEMICONDUCTOR DEVICE TESTING;

FAULT MAKING; MARCH TESTS; MEMORY FAULT MODELS; REALISTIC LINKED FAULTS;

SEMICONDUCTOR STORAGE;

EID: 0029712826     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (0)