Chasing subtle embedded RAM defects for nanometer technologies

Proceedings - International Test Conference

Volumn 2005, Issue , 2005, Pages 842-850

  Powell, Theo ^a   Kumar, Amrendra ^b   Rayhawk, Joseph ^b   Mukherjee, Nilanjan ^b  

^a TEXAS INSTRUMENTS   (United States)

^b MENTOR GRAPHICS CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ADDRESS DECODE OPEN FAULTS (ADOF) USING; EMBEDDED MEMORIES; NANOMETER TECHNOLOGIES; RAM DEFECTS;

ALGORITHMS; BUILT-IN SELF TEST; DESIGN FOR TESTABILITY; EMBEDDED SYSTEMS; NANOTECHNOLOGY; RANDOM ACCESS STORAGE;

FAULT TOLERANT COMPUTER SYSTEMS;

EID: 33847173268     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/TEST.2005.1584048     Document Type: Conference Paper

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