The influence of process parameters on chemistry, roughness and morphology of siloxane films deposited by an atmospheric plasma jet system

Plasma Processes and Polymers

Volumn 6, Issue SUPPL. 1, 2009, Pages

  Ramamoorthy, Amsarani ^a   Rahman, Mahfujur ^a   Mooney, Damian A ^a   Don MacElroy, James M ^a   Dowling, Denis P ^a  

^a UNIVERSITY COLLEGE DUBLIN   (Ireland)

Author keywords

Atmospheric plasma jet; Morphology; Particulates; Precursor flow rate and siloxane coatings; Refractive index

Indexed keywords

ATMOSPHERIC PLASMA JET; ATMOSPHERIC PLASMAS; PRECURSOR FLOW RATE AND SILOXANE COATINGS; PRECURSOR FLOW RATES; SILOXANE COATINGS;

ANGLE MEASUREMENT; ATMOSPHERIC MOVEMENTS; CHEMICAL PROPERTIES; COATINGS; CONTACT ANGLE; FOURIER TRANSFORM INFRARED SPECTROSCOPY; FOURIER TRANSFORMS; LIGHT REFRACTION; MORPHOLOGY; PLASMA ACCELERATORS; PLASMA JETS; PLASMAS; REFRACTIVE INDEX; REFRACTOMETERS; SCANNING ELECTRON MICROSCOPY; SURFACE ROUGHNESS; WAVELET TRANSFORMS; X RAY PHOTOELECTRON SPECTROSCOPY;

ATMOSPHERIC CHEMISTRY;

EID: 77954892929     PISSN: 16128850     EISSN: 16128869     Source Type: Journal    
DOI: 10.1002/ppap.200931109     Document Type: Conference Paper

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