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Volumn 3, Issue 7, 2010, Pages

Sub-15nm hard X-ray focusing with a new total-reflection zone plate

(6) Takano, Hidekazu a Tsuji, Takuya a Hashimoto, Takuto a Koyama, Takahisa a,b Tsusaka, Yoshiyuki a Kagoshima, Yasushi a

a UNIVERSITY OF HYOGO (Japan)

b SPring 8 ^* (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

FLAT SUBSTRATES; FOCUSING DEVICE; FOCUSING PROPERTIES; HARD X RAY; HARD-X-RAY FOCUSING; NANO-FOCUSING; REFLECTION ZONES; REFLECTIVE ZONES; TOTAL REFLECTION;

OPTICAL INSTRUMENTS; PLATES (STRUCTURAL COMPONENTS); REFLECTION; X RAYS;

FOCUSING;

EID: 77954517162 PISSN: 18820778 EISSN: 18820786 Source Type: Journal
DOI: 10.1143/APEX.3.076702 Document Type: Article

Times cited : (33)

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