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Volumn 186, Issue , 2009, Pages
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Development of a total reflection double-slit for evaluation of spatial coherence in hard X-ray region
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 73349134656
PISSN: 17426588
EISSN: 17426596
Source Type: Journal
DOI: 10.1088/1742-6596/186/1/012061 Document Type: Conference Paper |
Times cited : (7)
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References (6)
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