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Volumn 186, Issue , 2009, Pages

Development of a total reflection double-slit for evaluation of spatial coherence in hard X-ray region

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EID: 73349134656     PISSN: 17426588     EISSN: 17426596     Source Type: Journal    
DOI: 10.1088/1742-6596/186/1/012061     Document Type: Conference Paper
Times cited : (7)

References (6)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.