A monolithic Fresnel bimirror for hard X-rays and its application for coherence measurements

Journal of Synchrotron Radiation

Volumn 14, Issue 2, 2007, Pages 196-203

  Leitenberger, Wolfram ^a   Pietsch, Ullrich ^b  

^a UNIVERSITY OF POTSDAM   (Germany)

^b UNIVERSITY OF SIEGEN   (Germany)

Author keywords

Coherent X rays; Double slit interferometer; Reflectivity; Refraction index

Indexed keywords

COHERENT LIGHT; INTERFEROMETERS; MICROMETERS; REFLECTION; REFRACTIVE INDEX; SYNCHROTRON RADIATION; X RAY ANALYSIS;

COHERENT X-RAYS; FRESNEL BIMIRROR; SLIT DIMENSIONS; SPATIAL COHERENCE;

MIRRORS;

EID: 33847762309     PISSN: 09090495     EISSN: 16005775     Source Type: Journal    
DOI: 10.1107/S0909049507003846     Document Type: Article

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