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Volumn 58, Issue 14, 2010, Pages 4871-4882

Transmission electron microscopy study of the microstructure and crystallographic orientation relationships in V/Ag multilayers

Author keywords

Dislocations; Interface structure; Multilayers; Transmission electron microscopy; X ray diffraction

Indexed keywords

ADJACENT LAYERS; BODY-CENTERED CUBIC; COMPETITIVE KINETICS; CRYSTALLOGRAPHIC ORIENTATION RELATIONSHIPS; DISLOCATIONS; FACE-CENTERED CUBIC; HABIT PLANE; INTERFACE STRUCTURE; INTERFACE STRUCTURES; KINETIC BEHAVIOR; KURDJUMOV-SACHS; MISFIT STRESS; ORIENTATION RELATIONSHIP; PARALLEL PLANES; POLYCRYSTALLINE; STANDARD ORIENTATIONS; WAVY INTERFACE; WAVY STRUCTURES;

EID: 77953871829     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.actamat.2010.05.025     Document Type: Article
Times cited : (38)

References (54)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.