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Volumn 58, Issue 14, 2010, Pages 4871-4882
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Transmission electron microscopy study of the microstructure and crystallographic orientation relationships in V/Ag multilayers
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Author keywords
Dislocations; Interface structure; Multilayers; Transmission electron microscopy; X ray diffraction
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Indexed keywords
ADJACENT LAYERS;
BODY-CENTERED CUBIC;
COMPETITIVE KINETICS;
CRYSTALLOGRAPHIC ORIENTATION RELATIONSHIPS;
DISLOCATIONS;
FACE-CENTERED CUBIC;
HABIT PLANE;
INTERFACE STRUCTURE;
INTERFACE STRUCTURES;
KINETIC BEHAVIOR;
KURDJUMOV-SACHS;
MISFIT STRESS;
ORIENTATION RELATIONSHIP;
PARALLEL PLANES;
POLYCRYSTALLINE;
STANDARD ORIENTATIONS;
WAVY INTERFACE;
WAVY STRUCTURES;
MICROSTRUCTURE;
MORPHOLOGY;
MULTILAYERS;
SCANNING ELECTRON MICROSCOPY;
X RAY DIFFRACTION;
TRANSMISSION ELECTRON MICROSCOPY;
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EID: 77953871829
PISSN: 13596454
EISSN: None
Source Type: Journal
DOI: 10.1016/j.actamat.2010.05.025 Document Type: Article |
Times cited : (38)
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References (54)
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