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Volumn 88, Issue 17, 2008, Pages 2559-2567

Transmission electron microscopy investigation of the atomic structure of interfaces in nanoscale Cu-Nb multilayers

Author keywords

CulNb; Deformation; Lattice distortion; Multilayer; Nanostructure; Orientation relationship

Indexed keywords

ABS RESINS; COPPER; CRYSTAL ATOMIC STRUCTURE; ELECTRON MICROSCOPES; FAST FOURIER TRANSFORMS; FOURIER TRANSFORMS; HIGH RESOLUTION ELECTRON MICROSCOPY; INORGANIC COATINGS; MAGNETRON SPUTTERING; MICROSCOPIC EXAMINATION; MULTILAYERS; NANOSTRUCTURED MATERIALS; NIOBIUM; SILICON;

EID: 54049137201     PISSN: 14786435     EISSN: 14786443     Source Type: Journal    
DOI: 10.1080/14786430802380485     Document Type: Article
Times cited : (50)

References (26)
  • 16
    • 54049147953 scopus 로고    scopus 로고
    • G. Wassermann, Arch. Eisenhuttermn. 16 (1933) p.647.
    • G. Wassermann, Arch. Eisenhuttermn. 16 (1933) p.647.
  • 26
    • 54049104160 scopus 로고    scopus 로고
    • private communication, unpublished work from CMU 2007
    • S. C. V. Lim, C. Roberts and A. Rollett, private communication, unpublished work from CMU (2007).
    • Lim, S.C.V.1    Roberts, C.2    Rollett, A.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.