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Volumn 88, Issue 17, 2008, Pages 2559-2567
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Transmission electron microscopy investigation of the atomic structure of interfaces in nanoscale Cu-Nb multilayers
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Author keywords
CulNb; Deformation; Lattice distortion; Multilayer; Nanostructure; Orientation relationship
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Indexed keywords
ABS RESINS;
COPPER;
CRYSTAL ATOMIC STRUCTURE;
ELECTRON MICROSCOPES;
FAST FOURIER TRANSFORMS;
FOURIER TRANSFORMS;
HIGH RESOLUTION ELECTRON MICROSCOPY;
INORGANIC COATINGS;
MAGNETRON SPUTTERING;
MICROSCOPIC EXAMINATION;
MULTILAYERS;
NANOSTRUCTURED MATERIALS;
NIOBIUM;
SILICON;
ATOMIC STRUCTURES;
BILAYER PERIODS;
CULNB;
EARLY STAGES;
HIGH-RESOLUTION;
HRTEM IMAGES;
IMAGING;
LATTICE DISTORTION;
LOCAL DISTORTIONS;
LOCAL REGIONS;
MULTILAYER STRUCTURES;
NANOSCALE;
ORIENTATION RELATIONSHIP;
ORIENTATION RELATIONSHIPS;
SEED LAYERS;
SI (100) SUBSTRATES;
SPATIAL VARIATIONS;
HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY;
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EID: 54049137201
PISSN: 14786435
EISSN: 14786443
Source Type: Journal
DOI: 10.1080/14786430802380485 Document Type: Article |
Times cited : (50)
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References (26)
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