Residual strain and texture in free-standing nanoscale Cu-Nb multilayers

Journal of Applied Physics

Volumn 102, Issue 8, 2007, Pages

  Aydiner, C C ^a   Brown, D W ^a   Misra, A ^a   Mara, N A ^a   Wang, Y C ^a   Wall, J J ^a   Almer, J ^a  

^a NONE

Author keywords

[No Author keywords available]

Indexed keywords

ANISOTROPY; DIFFRACTION; STRAIN; STRESS CONCENTRATION; SYNCHROTRONS; VAPOR DEPOSITION; X RAYS;

CU DIFFRACTION; RESIDUAL STRAINS; YIELD DIFFRACTION;

MULTILAYERS;

EID: 35648977075     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2794862     Document Type: Article

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