Potential-modulated attenuated total reflectance characterization of charge injection processes in monolayer-tethered CdSe nanocrystals

Journal of Physical Chemistry Letters

Volumn 1, Issue 12, 2010, Pages 1900-1905

  Araci, Zeynep Ozkan ^a   Shallcross, Clayton R ^a,b   Armstrong, Neal R ^a   Saavedra, S Scott ^a  

^a University of Arizona   (United States)

^b UNIVERSITY OF COLOGNE   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

APPARENT RATE CONSTANT; ATTENUATED TOTAL REFLECTANCE; CDSE NANOCRYSTALS; CHARGE INJECTION PROCESS; CONDUCTION BAND EDGE; EXCITON ABSORPTIONS; IN-PHASE; INDIUM TIN OXIDE; MODULATION FREQUENCIES; ONSET POTENTIAL; OUT OF PHASE; RATE LIMITING; REDOX PROCESS; SUBMONOLAYER FILMS; TETHER CHAIN;

AVIATION; CADMIUM COMPOUNDS; ELECTRON INJECTION; ELECTRON MOBILITY; ITO GLASS; MONOLAYERS; NANOCRYSTALS; RATE CONSTANTS; REFLECTION; SPECTROELECTROCHEMISTRY; SUPERALLOYS; TIN; TITANIUM COMPOUNDS;

CADMIUM ALLOYS;

EID: 77953764742     PISSN: None     EISSN: 19487185     Source Type: Journal    
DOI: 10.1021/jz100475j     Document Type: Article

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