Programmable aging sensor for automotive safety-critical applications

Proceedings -Design, Automation and Test in Europe, DATE

Volumn , Issue , 2010, Pages 618-621

  Vazquez, J C ^a,b   Champac, V ^a   Teixeira, I C ^b,c   Santos, M B ^b,c   Teixeira, J P ^b,c  

^a Instituto Nacional de Astrofísica   (United States)

^b INESC ID   (Portugal)

^c INSTITUTO SUPERIOR TÉCNICO   (Portugal)

Author keywords

Aging sensors; Failure prediction; Reliability in nanometer technologies

Indexed keywords

AUTOMOBILE ELECTRONIC EQUIPMENT; OUTAGES; RELIABILITY; SENSITIVITY ANALYSIS;

AUTOMOTIVE APPLICATIONS; ELECTRONIC SYSTEMS; FAILURE PREDICTION; HARSH ENVIRONMENT; LONG TERM PERFORMANCE; NANOMETER TECHNOLOGY; POWER SUPPLY VOLTAGE; QUALITY REQUIREMENTS;

SAFETY ENGINEERING;

EID: 77953117251     PISSN: 15301591     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/date.2010.5457131     Document Type: Conference Paper

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