A black box method for stability analysis of arbitrary SRAM cell structures

Proceedings -Design, Automation and Test in Europe, DATE

Volumn , Issue , 2010, Pages 795-800

  Wieckowski, M ^a   Sylvester, D ^a   Blaauw, D ^a   Chandra, V ^b   Idgunji, S ^b   Pietrzyk, C ^b   Aitken, R ^b  

^a UNIVERSITY OF MICHIGAN   (United States)

^b ARM R and D   (United States)

Author keywords

Dynamic noise margin; Memory; Robustness; Stability; Static noise margin

Indexed keywords

CONVERGENCE OF NUMERICAL METHODS; CURVE FITTING; CYTOLOGY; DATA STORAGE EQUIPMENT; FAILURE ANALYSIS; IMPORTANCE SAMPLING; ROBUSTNESS (CONTROL SYSTEMS); STABILITY; STATIC RANDOM ACCESS STORAGE;

BLACK BOX METHOD; BUTTERFLY CURVES; CELL CHARACTERIZATION; DYNAMIC NOISE MARGINS; DYNAMIC ROBUSTNESS; STABILITY ANALYSIS; STATIC NOISE MARGIN; VECTOR FIELD ANALYSIS;

CELLS;

EID: 77953096884     PISSN: 15301591     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/date.2010.5456943     Document Type: Conference Paper

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