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Volumn 96, Issue 20, 2010, Pages

Anisotropy of electrical conductivity in a pentacene crystal grain on SiO2 evaluated by atomic-force-microscope potentiometry and electrostatic simulation

(5) Ohashi, Noboru a,b Tomii, Hiroshi a Sakai, Masatoshi a Kudo, Kazuhiro a Nakamura, Masakazu a

a CHIBA UNIVERSITY (Japan)

b NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL GRAINS; DRIFT MOBILITIES; ELECTRICAL CONDUCTIVITY; ELECTROSTATIC SIMULATIONS; HARMONIC MEAN; NONLINEAR POTENTIAL; PENTACENE CRYSTALS; PENTACENE THIN-FILM TRANSISTORS; PENTACENES; POTENTIOMETRY; SURFACE POTENTIAL DISTRIBUTIONS; THICKNESS VARIATION;

CARRIER MOBILITY; ELECTRIC CONDUCTIVITY; ELECTROSTATICS; POTENTIOMETERS (ELECTRIC MEASURING INSTRUMENTS); SEMICONDUCTING ORGANIC COMPOUNDS; SILICON COMPOUNDS; SURFACE TOPOGRAPHY; THIN FILM TRANSISTORS; TOPOGRAPHY;

ANISOTROPY;

EID: 77953006016 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.3430041 Document Type: Article

Times cited : (3)

References (17)

1
- 0035025694
- IBMJAE 0018-8646,. 10.1147/rd.451.0011
- C. D. Dimitrakopoulos and D. J. Mascaro, IBM J. Res. Dev. IBMJAE 0018-8646 45, 11 (2001). 10.1147/rd.451.0011
- (2001) IBM J. Res. Dev. , vol.45 , pp. 11
- Dimitrakopoulos, C.D.¹ Mascaro, D.J.²

2
- 0142231467
- ADVMEW 0935-9648,. 10.1002/adma.200305158
- Y. Zhang, J. R. Petta, S. Ambily, Y. Shen, D. C. Ralph, and G. G. Malliaras, Adv. Mater. ADVMEW 0935-9648 15, 1632 (2003). 10.1002/adma.200305158
- (2003) Adv. Mater. , vol.15 , pp. 1632
- Zhang, Y.¹ Petta, J.R.² Ambily, S.³ Shen, Y.⁴ Ralph, D.C.⁵ Malliaras, G.G.⁶

3
- 2442680390
- APPLAB 0003-6951,. 10.1063/1.1704874
- O. D. Jurchescu, J. Baas, and T. T. M. Palstra, Appl. Phys. Lett. APPLAB 0003-6951 84, 3061 (2004). 10.1063/1.1704874
- (2004) Appl. Phys. Lett. , vol.84 , pp. 3061
- Jurchescu, O.D.¹ Baas, J.² Palstra, T.T.M.³

4
- 33745452875
- Anisotropic field effect mobility in single crystal pentacene
- DOI 10.1063/1.2216400
- J. Y. Lee, S. Roth, and Y. W. Park, Appl. Phys. Lett. APPLAB 0003-6951 88, 252106 (2006). 10.1063/1.2216400 (Pubitemid 43954806)
- (2006) Applied Physics Letters , vol.88 , Issue.25 , pp. 252106
- Lee, J.Y.¹ Roth, S.² Park, Y.W.³

5
- 0040158519
- APPLAB 0003-6951,. 10.1063/1.1394952
- M. L. Swiggers, G. Xia, J. D. Slinker, A. A. Gorodetsky, G. G. Malliaras, R. L. Headrick, B. T. Weslowski, R. N. Shashidhar, and C. S. Dulcey, Appl. Phys. Lett. APPLAB 0003-6951 79, 1300 (2001). 10.1063/1.1394952
- (2001) Appl. Phys. Lett. , vol.79 , pp. 1300
- Swiggers, M.L.¹ Xia, G.² Slinker, J.D.³ Gorodetsky, A.A.⁴ Malliaras, G.G.⁵ Headrick, R.L.⁶ Weslowski, B.T.⁷ Shashidhar, R.N.⁸ Dulcey, C.S.⁹

6
- 33947110572
- Orientation control of pentacene molecules and transport anisotropy of the thin film transistors by photoaligned polyimide film
- DOI 10.1063/1.2711776
- D. Guo, K. Sakamoto, K. Miki, S. Ikeda, and K. Saiki, Appl. Phys. Lett. APPLAB 0003-6951 90, 102117 (2007). 10.1063/1.2711776 (Pubitemid 46398437)
- (2007) Applied Physics Letters , vol.90 , Issue.10 , pp. 102117
- Guo, D.¹ Sakamoto, K.² Miki, K.³ Ikeda, S.⁴ Saiki, K.⁵

7
- 4544238682
- THSFAP 0040-6090,. 10.1016/j.tsf.2004.06.065
- H. Yanagisawa, T. Tamaki, M. Nakamura, and K. Kudo, Thin Solid Films THSFAP 0040-6090 464-465, 398 (2004). 10.1016/j.tsf.2004.06.065
- (2004) Thin Solid Films , vol.464-465 , pp. 398
- Yanagisawa, H.¹ Tamaki, T.² Nakamura, M.³ Kudo, K.⁴

8
- 19144368128
- Structure of pentacene thin films
- DOI 10.1063/1.1826229
- R. Ruiz, A. C. Mayer, G. G. Malliaras, B. Nickel, G. Scoles, A. Kazimirov, H. Kim, R. L. Headrick, and Z. Islam, Appl. Phys. Lett. APPLAB 0003-6951 85, 4926 (2004). 10.1063/1.1826229 (Pubitemid 40715170)
- (2004) Applied Physics Letters , vol.85 , Issue.21 , pp. 4926-4928
- Ruiz, R.¹ Mayer, A.C.² Malliaras, G.G.³ Nickel, B.⁴ Scoles, G.⁵ Kazimirov, A.⁶ Kim, H.⁷ Headrick, R.L.⁸ Islam, Z.⁹

9
- 0001298383
- JAPIAU 0021-8979,. 10.1063/1.363032
- C. D. Dimitrakopoulos, A. R. Brown, and A. Pomp, J. Appl. Phys. JAPIAU 0021-8979 80, 2501 (1996). 10.1063/1.363032
- (1996) J. Appl. Phys. , vol.80 , pp. 2501
- Dimitrakopoulos, C.D.¹ Brown, A.R.² Pomp, A.³

10
- 17944365907
- Potential mapping of pentacene thin-film transistors using purely electric atomic-force-microscope potentiometry
- DOI 10.1063/1.1891306, 122112
- M. Nakamura, N. Goto, N. Ohashi, M. Sakai, and K. Kudo, Appl. Phys. Lett. APPLAB 0003-6951 86, 122112 (2005). 10.1063/1.1891306 (Pubitemid 40596913)
- (2005) Applied Physics Letters , vol.86 , Issue.12 , pp. 1-3
- Nakamura, M.¹ Goto, N.² Ohashi, N.³ Sakai, M.⁴ Kudo, K.⁵

11
- 77953011713
- IEICE Technical Report No. 189317, (unpublished).
- Y. Sakai, M. Nakamura, M. Sakai, K. Kudo, Y. Nakayama, H. Ishii, T. Suzuki, and M. Tanemura, IEICE Technical Report No. 189317, 2008 (unpublished).
- (2008)
- Sakai, Y.¹ Nakamura, M.² Sakai, M.³ Kudo, K.⁴ Nakayama, Y.⁵ Ishii, H.⁶ Suzuki, T.⁷ Tanemura, M.⁸

12
- 45749084501
- APPLAB 0003-6951,. 10.1063/1.2943659
- R. Matsubara, N. Ohashi, M. Sakai, K. Kudo, and M. Nakamura, Appl. Phys. Lett. APPLAB 0003-6951 92, 242108 (2008). 10.1063/1.2943659
- (2008) Appl. Phys. Lett. , vol.92 , pp. 242108
- Matsubara, R.¹ Ohashi, N.² Sakai, M.³ Kudo, K.⁴ Nakamura, M.⁵

13
- 15844375181
- Heritage and early history of the boundary element method
- DOI 10.1016/j.enganabound.2004.12.001, PII S0955799705000020
- A. Cheng and D. T. Cheng, Eng. Anal. Boundary Elem. EABAEL 0955-7997 29, 268 (2005). 10.1016/j.enganabound.2004.12.001 (Pubitemid 40424042)
- (2005) Engineering Analysis with Boundary Elements , vol.29 , Issue.3 , pp. 268-302
- Cheng, A.H.-D.¹ Cheng, D.T.²

14
- 0037210796
- Electrical characteristics of pentacene-based Schottky diodes
- DOI 10.1016/S0925-3467(02)00178-7, PII S0925346702001787
- Y. S. Lee, J. H. Park, and J. S. Choi, Opt. Mater. OMATET 0925-3467 21, 433 (2003). 10.1016/S0925-3467(02)00178-7 (Pubitemid 35385530)
- (2003) Optical Materials , vol.21 , Issue.1-3 , pp. 433-437
- Lee, Y.S.¹ Park, J.H.² Choi, J.S.³

15
- 79956009334
- Deep-level defect characteristics in pentacene organic thin films
- DOI 10.1063/1.1459117
- Y. S. Yang, S. H. Kim, J. Lee, H. Y. Chu, L. M. Do, H. Lee, J. Oh, and T. Zyung, Appl. Phys. Lett. APPLAB 0003-6951 80, 1595 (2002). 10.1063/1.1459117 (Pubitemid 34268842)
- (2002) Applied Physics Letters , vol.80 , Issue.9 , pp. 1595
- Yang, Y.S.¹ Kim, S.H.² Lee, J.-I.³ Chu, H.Y.⁴ Do, L.-M.⁵ Lee, H.⁶ Oh, J.⁷ Zyung, T.⁸ Ryu, M.K.⁹ Jang, M.S.¹⁰

16
- 35549003608
- Conductivity fluctuation within a crystalline domain and its origin in pentacene thin-film transistors
- DOI 10.1063/1.2799743
- N. Ohashi, H. Tomii, R. Matsubara, M. Sakai, K. Kudo, and M. Nakamura, Appl. Phys. Lett. APPLAB 0003-6951 91, 162105 (2007). 10.1063/1.2799743 (Pubitemid 350004027)
- (2007) Applied Physics Letters , vol.91 , Issue.16 , pp. 162105
- Ohashi, N.¹ Tomii, H.² Matsubara, R.³ Sakai, M.⁴ Kudo, K.⁵ Nakamura, M.⁶

17
- 77952981509
- Proceedings of the 2008 MRS Fall Meeting, 3 December (unpublished);, "" (unpublished).
- SiO2 and Its Influence on Electronic Band Structure. " (unpublished).
- (2008) SiO2 and Its Influence on Electronic Band Structure
- Matsubara, R.¹ Sakai, Y.² Ohashi, N.³ Sakai, M.⁴ Kudo, K.⁵ Kumagai, A.⁶ Yoshimoto, N.⁷ Nakamura, M.⁸ Matsubara, R.⁹ Sakai, M.¹⁰ Kudo, K.¹¹ Yoshimoto, N.¹² Hirosawa, I.¹³ Nakamura, M.¹⁴

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