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Volumn 79, Issue 9, 2001, Pages 1300-1302

Orientation of pentacene films using surface alignment layers and its influence on thin-film transistor characteristics

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0040158519     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1394952     Document Type: Article
Times cited : (135)

References (17)
  • 12
    • 0039408185 scopus 로고    scopus 로고
    • note
    • The ordering perpendicular to the surface was also independently measured by scans through (00L) reflections. These measurements indicated a high degree of alignment, since several orders of sharp reflections from both the thin film and bulk phases were present.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.