-
2
-
-
0031103927
-
-
D. J. Grundlach, Y. Y. Lin, T. N. Jackson, S. F. Nelson, and D. G. Sohlom, IEEE Electron Device Lett. 18, 87 (1997).
-
(1997)
IEEE Electron Device Lett.
, vol.18
, pp. 87
-
-
Grundlach, D.J.1
Lin, Y.Y.2
Jackson, T.N.3
Nelson, S.F.4
Sohlom, D.G.5
-
8
-
-
0032679994
-
-
D. Shenoy, K. Grueneberg, J. Naciri, R. Shashidhar, Y. Nastishyn, R. Pollack, and O. Lavrentovich, Proc. SPIE 3635, 24 (1999).
-
(1999)
Proc. SPIE
, vol.3635
, pp. 24
-
-
Shenoy, D.1
Grueneberg, K.2
Naciri, J.3
Shashidhar, R.4
Nastishyn, Y.5
Pollack, R.6
Lavrentovich, O.7
-
9
-
-
0034511888
-
-
J. Naciri, J. Y. Fang, M. Moore, D. Shenoy, C. S. Dulcey, and R. Shashidhar, Chem. Mater. 12, 3288 (2000).
-
(2000)
Chem. Mater.
, vol.12
, pp. 3288
-
-
Naciri, J.1
Fang, J.Y.2
Moore, M.3
Shenoy, D.4
Dulcey, C.S.5
Shashidhar, R.6
-
10
-
-
0001029895
-
-
R. L. Headrick, S. Kycia, Y. K. Park, A. R. Woll. and J. D. Brock, Phys. Rev. B 54, 14686 (1996).
-
(1996)
Phys. Rev. B
, vol.54
, pp. 14686
-
-
Headrick, R.L.1
Kycia, S.2
Park, Y.K.3
Woll, A.R.4
Brock, J.D.5
-
11
-
-
0001181782
-
-
X. Wei, X. Zhuang, S. Hong, T. Goto, and Y. R. Shen, Phys. Rev. Lett. 82, 4256 (1999).
-
(1999)
Phys. Rev. Lett.
, vol.82
, pp. 4256
-
-
Wei, X.1
Zhuang, X.2
Hong, S.3
Goto, T.4
Shen, Y.R.5
-
12
-
-
0039408185
-
-
note
-
The ordering perpendicular to the surface was also independently measured by scans through (00L) reflections. These measurements indicated a high degree of alignment, since several orders of sharp reflections from both the thin film and bulk phases were present.
-
-
-
-
14
-
-
0001090687
-
-
H. Sirringhaus, R. J. Wilson, R. H. Friend, M. Inbasekaran, W. Wu, E. P. Woo, M. Grell, and D. D. C. Bradley, Appl. Phys. Lett. 77, 406 (2000).
-
(2000)
Appl. Phys. Lett.
, vol.77
, pp. 406
-
-
Sirringhaus, H.1
Wilson, R.J.2
Friend, R.H.3
Inbasekaran, M.4
Wu, W.5
Woo, E.P.6
Grell, M.7
Bradley, D.D.C.8
-
16
-
-
0032205698
-
-
J. C. Wittmann, C. Straupé, S. Mayer. B. Lotz, P. Lang, G. Horowitz, and F. Garnier, Synth. Met. 333, 272 (1998).
-
(1998)
Synth. Met.
, vol.333
, pp. 272
-
-
Wittmann, J.C.1
Straupé, C.2
Mayer, S.3
Lotz, B.4
Lang, P.5
Horowitz, G.6
Garnier, F.7
-
17
-
-
0034844298
-
-
X. L. Chen, A. J. Lovinger, Z. Bao, and J. Sapjeta, Chem. Mater. 13, 1341 (2001).
-
(2001)
Chem. Mater.
, vol.13
, pp. 1341
-
-
Chen, X.L.1
Lovinger, A.J.2
Bao, Z.3
Sapjeta, J.4
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