Orientation of pentacene films using surface alignment layers and its influence on thin-film transistor characteristics

Applied Physics Letters

Volumn 79, Issue 9, 2001, Pages 1300-1302

  Swiggers, M L ^a   Xia, G ^a   Slinker, J D ^a   Gorodetsky, A A ^a   Malliaras, G G ^a   Headrick, R L ^b   Weslowski, Brian T ^c   Shashidhar, R N ^c   Dulcey, C S ^c  

^a Department of Materials Science and Engineering   (United States)

^b Department of Population Medicine and Diagnostic Sciences   (United States)

^c NAVAL RESEARCH LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0040158519     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1394952     Document Type: Article

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