Testability design prevents harm

IEEE Aerospace and Electronic Systems Magazine

Volumn 25, Issue 3, 2010, Pages 35-43

  Ungar, Louis Y ^a  

^a ATE Solutions Inc   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COST SAVING; IT PRODUCTS; PRODUCT LIFE; QUALITY PRODUCT; REVENUE GENERATION; TESTABILITY; UPPER LIMITS;

DESIGN FOR TESTABILITY; LIFE CYCLE; PROFITABILITY;

COSTS;

EID: 77952559744     PISSN: 08858985     EISSN: None     Source Type: Journal    
DOI: 10.1109/MAES.2010.5463955     Document Type: Article

References (29)

1. Louis Y. Ungar, Automatic Testing and Testability, Engineering Extension Course taught at UCLA, 1981.
2. T. W. Williams and N. C. Brown, Defect Level as a Function of Fault Coverage, IEEE Trans. Computers, Vol. C-30, No. 12, December 1981, pp. 987-988.
3. US Navy, MIL-HDBK-2165 Testability Handbook For Systems & Equipment, July 1995.
4. C. Dislis et al., Economics of Design and Test of Electronic Circuits and Systems, Ellis Horwood, New York, 1995.
5. Thomas J. Coughlin, Designing for Testability... The Technology, the Technique, and the Economics, Web Posting, July 30, 1996, http://members.aol. com/prpca/designof.htm.
6. D. Farren and T. Ambler, The Economics of System-Level Testing, IEEE Design & Test of Computers, Vol. 14, No. 3, July 1997, pp. 51-58.
7. S. Wei, P. K. Nag, R. D. Blanton, A. Gattiker and W. Maly, To DFT or not to DFT, Proc. 1997 International Test Conf., pp. 557-566, November 1997.
8. Louis Y. Ungar and Tony Ambler, Economics of Built-in Self-Test, IEEE Design and Test of Computers, September/October 2001, pp. 70-79.
9. S. Davidson, S. T. Ambler and H. Davidson, Behavioral Test Economics, Proceedings IEEE Int Test Conf., 2006, Paper 1.3.
10. Louis Y. Ungar, An Economics Model of Supportability Through Design for Testability, Proc. of AutoTestCon, September 2006, pp. 74-79.
11. S. Davidson, Justifying DFT with a Hierarchical Top-Down Cost-Benefit Model, Submitted for publication in the Proc. International Test Conference in 2008.
12. L. Y. Ungar, Design for Testability and for Built-in Self Test - Course Notes, A. T. E. Solutions, Inc., 2003.
13. Zulki Khan, Weighing Dollars Vs. Test Strategies, EMSNow, December 11, 2007, http://www.emsnow.com/npps/story.cfm?id=30631.
14. L. Y. Ungar, et al., IEEE-1149.x Standards: Achievements vs. Expectations, Proc. IEEE Systems Readiness Technology Conf. AutoTestCon 01, IEEE Press, Piscataway, NJ, September 2001.
15. Surface Mount Technology Association, TP-101C, Testability Guidelines, SMTA 2002.
16. Testability Management Action Group (TMAG), established by testability professionals to promote DFT to managers, , formed in December 2007.
17. Louis Y. Ungar, Design for Diagnosability Guidelines, Proceedings of AutoTestCon, September 2007, pp. 6-15.
18. Nick Farrell, Microsoft sued over Xbox flaws, The Inquirer, 06 December 2005, .
19. DeanTakahashi, Microsoft Dismisses Repair Fees On Early Xbox 360s, Acknowledges Quality Problems, Mercury News, September 21, 2006, .
20. Ben Kuchera, Save your 360 from the dreaded red lights with this fix, ars, June 16, 2006, .
21. Ben Kuchera, Xbox 360 failure rates worse than most consumer electronics, ars technica, February 14, 2008, .
22. Colleen Taylor, Microsoft extends Xbox 360 warranty at $1B cost, Electr. News, July 2007, .
23. Priya Ganapati, Microsoft Cops to Xbox Flaws, TheStreet.com, July 5, 2007, .
24. Biospace.com, Medtronic Sued Over Defective Sprint Fidelis Lead Wires, PR Newswire, October 16, 2007, .
25. Colin Holland, ATV's Recalled as Modules Overheat, EE Times Europe, February 19, 2008, .
26. Associated Press, White-space converter fizzles, again, February 11, 2008, Forbes.com, .
27. A. T. E. Solutions, Inc., The Testability Director v. 3.2 software, March 2005.
28. Louis Y. Ungar, Testability Beyond JTAG, Evaluation Engineering, September 2005.
29. Scott Davidson and Helen Davidson, The Psychology of Electronics Testing, IEEE Design and Test of Computers, September 2007, pp. 494-501.