To DFT or not to DFT?

IEEE International Test Conference (TC)

Volumn , Issue , 1997, Pages 557-566

  Wei, S ^a   Nag, P K ^a   Blanton, R D ^a   Gattiker, A ^a   Maly, W ^a  

^a CARNEGIE MELLON UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COST ACCOUNTING; DECISION MAKING; MATHEMATICAL MODELS;

DESIGN FOR TESTABILITY (DFT);

INTEGRATED CIRCUIT TESTING;

EID: 0031387345     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (19)