Design for Diagnosability guidelines

AUTOTESTCON (Proceedings)

Volumn , Issue , 2007, Pages 6-15

  Ungar, Louis Y ^a  

^a ATE Solutions Inc   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CIRCUIT DESIGNERS; CIRCUIT DESIGNS; DESIGN-FOR-DIAGNOSABILITY; DIAGNOSABILITY; DISTINGUISHABILITY; FALSE ALARMS; FAULT ISOLATION; INTEGRATED DIAGNOSTICS; LOWER COST; REPAIR PROCESSES; SPECIFIC DESIGN; VENN DIAGRAMS;

ALARM SYSTEMS; COST EFFECTIVENESS; DESIGN FOR TESTABILITY; ELECTRIC FAULT CURRENTS; FAULT DETECTION; HEALTH; INTEGRATED CIRCUIT MANUFACTURE; KETONES; MAINTENANCE; NETWORKS (CIRCUITS); REPAIR; SEMANTICS; TERMINOLOGY;

PROCESS ENGINEERING;

EID: 48049119908     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/AUTEST.2007.4374195     Document Type: Conference Paper

References (14)

1. Department of Defense, MIL-Std-2165, Testability Program for Electronic Systems and Equipment 26 January 1985.
2. Department of Defense, MIL-HDBK-2165. Testability Program for Electronic Systems and Equipment 31 July 1995
3. United Kingdom Ministry of Defence Standard 00-13/Issue 3, 17 June 1994.
4. Institute of Electrical and Electronics Engineers, Test Access Port and Boundary-Scan Architecture, Standard 1149.1-2001.
5. Surface Mount Technology Association, SMTA Testability Guidelines 101C, 2002.
6. The Testability Director, Version 3.2, Software, A.T.E. Solutions, Inc. 2003. http://www.ATESolutionsInc.com/OurProducts/TestabilityDirector/
7. Ungar, L. Y. An Economics Model of Supportability Through Design for Testability, Proc. of AutoTestCon 2006, IEEE, Sept. 2006.
8. Simpson, William R., et al., Prediction and Analysis of Testability Attributes: Organizational-Level Testability Prediction, Report Submittal to Rome Air Development Center, RADC-TR-85-268, Feb. 1986.
9. Ungar, Louis Y. and Parameswaran, Rajini, Knowledge Base to Manage the Grading and Selection of Testability Guidelines, Proceeding of AutoTestCon 2005, IEEE, September 2005.
10. Dislis, C. et. al., Test Economics and Design for Testability for Electronic Circuits and Systems, Ellis Horwood, 1995.
11. Ungar, Louis Y. and Ambler, Tony, Economics of Built-In Self Test, IEEE Design & Test of Computers, September - October, 2001.
12. Ungar, Louis Y., Ambler, Anthony P., Ben Bassat, M., Economics of Diagnosis, Proceeding of AutoTestCon 1997, IEEE, September 1997.
13. Test Definitions, by A.T.E. Solutions, Inc. www.BestTest.com/ BestTestDirectory/TestDefinitions/
14. Misra, A., DTOOL: A Diagnosability Analysis Tool for the Multigraph Architecture, Vanderbuilt University, October, 1995. www.isis.vanderbilt.edu/ research/fdir/dtoolman/dtoolman.html