The psychology of electronic test

IEEE Design and Test of Computers

Volumn 24, Issue 5, 2007, Pages 494-501

  Davidson, Scott ^a   Davidson, Helen ^b  

^a SUN MICROSYSTEMS   (United States)

^b Davidson Decision Resources ^*  (United States)

Author keywords

Decision making; Designers; DFT engineers; Discrete Fourier transforms; Economics; Lead; Organizations; Psychological factors; Psychology; Psychology of electronic test; Test engineers; Timing

Indexed keywords

ELECTRONIC TEST; PYSCHOLOGICAL FACTORS; TEST ENGINEERS;

DECISION MAKING; DISCRETE FOURIER TRANSFORMS; SOCIETIES AND INSTITUTIONS; TIMING DEVICES;

PSYCHOLOGY COMPUTING;

EID: 35348873783     PISSN: 07407475     EISSN: None     Source Type: Journal    
DOI: 10.1109/MDT.2007.175     Document Type: Conference Paper

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