Behavioral test economics

Proceedings - International Test Conference

Volumn , Issue , 2006, Pages

  Davidson, Scott ^a   Ambler, Anthony ^b   Davidson, Helen ^c  

^a SUN MICROSYSTEMS   (United States)

^b UNIVERSITY OF TEXAS AT AUSTIN   (United States)

^c UNIVERSITY OF OREGON   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DECISION MAKING; ECONOMIC ANALYSIS; ENGINEERING TECHNOLOGY; INTEGRATED CIRCUITS; PROBLEM SOLVING;

BEHAVIORAL ECONOMICS; ECONOMIC SELF INTEREST; TEST ENGINEERS;

OPTICAL TESTING;

EID: 39749086247     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/TEST.2006.297651     Document Type: Conference Paper

References (22)