Space charged region in GaN and InN nanocolumns investigated by atomic force microscopy

Physica Status Solidi (C) Current Topics in Solid State Physics

Volumn 5, Issue 6, 2008, Pages 1609-1611

  Niebelschutz M ^a   Cimalla, V ^a   Ambacher, O ^a   Machleidt, T ^a   Franke, K H ^a   Ristic, J ^b   Grandal, J ^b   Sanchez Garcia M A ^b   Calleja, E ^b  

^a ILMENAU UNIVERSITY OF TECHNOLOGY   (Germany)

^b UNIVERSIDAD POLITÉCNICA DE MADRID   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

AFM IMAGE; AFM TIP; AS-GROWN; CONDUCTION PATHS; DEPLETION REGION; ELECTRON ACCUMULATION; FERMI LEVEL PINNING; HIGH QUALITY; NANO-COLUMNS; NANOCOLUMN; NON-POLAR;

CRYSTAL GROWTH; GALLIUM ALLOYS; GALLIUM NITRIDE; IMAGE RECONSTRUCTION; MOLECULAR BEAM EPITAXY; MOLECULAR BEAMS; SCANNING ELECTRON MICROSCOPY;

ATOMIC FORCE MICROSCOPY;

EID: 77951223015     PISSN: 18626351     EISSN: 16101642     Source Type: Journal    
DOI: 10.1002/pssc.200778533     Document Type: Conference Paper

References (21)

1. S. Nakamura, T. Mukai, and H. M. Seno, Appl. Phys. Lett. 64, 1687 (1994).
2. S. Nakamura, Science 281, 956 (1998).
3. S. Strife and H. Morkoc, J. Vac. Sci. Technol. B 10, 1237 (1992).
4. I. Vurgaftman, J. R. Meyer, and L. R. Ram-Mohan, J. Appl. Phys. 89, 5815 (2001).
5. D. Zhuang and J. H. Edgar, Mater. Sci. Eng. R. 48, 1 (2005).
6. V. Dobrokhotov et al., J. Appl. Phys. 99, 104302 (2006).
7. L. Cerutti, J. Ristić, S. Fernández-Garrido, E. Calleja, A. Trampert, K. H. Ploog, S. Lazic, and J. M. Calleja, Appl. Phys. Lett. 88, 213114 (2006)
8. M. A. Sánchez-García, J. Grandal, E. Calleja, S. Lazic, J. M. Calleja, and A. Trampert, phys. stat. sol. (b) 243, 1490 (2006).
9. T. Stoica, R. Meijers, R. Calarco, T. Richter, and H. Lüth, J. Cryst. Growth 290, 241(2006).
10. E. Calleja, M. A. Sanchez-Garcia, F. J. Sanchez, F. Calle, F. B. Naranjo, E. Munoz, U. Jahn, and K. Ploog, Phys. Rev. B 62, 16826 (2000).
11. J. Ristic, M. A. Sanchez-Garcia, E. Calleja, J. Sanchez-Paramo, J. M. Calleja, U. Jahn, and K. H. Ploog, phys. stat. sol. (a) 192, 60 (2002).
12. H. Romanus, J. Schadewald, V. Cimalla, M. Niebelschütz, T. Machleidt, K.-H. Franke, L. Spiess, and O. Ambacher, Microelectron. Eng. 84, 528 (2007).
13. T. Machleidt, R. Kästner, and K.-H. Franke, in: Reconstruction and geometric assessment of AFM tips, in: Nanoscale Calibration Standards and Methods, edited by G. Wilkening, L. Koenders (Wiley-VCH, 2005).
14. C. Freyhardt et al., Exp. Phys. 6, 873 (1992).
15. S. P. Muraka, Metallization - Theory and Practice for VLSI and ULSI, pp. 250 (1993).
16. J. G. Park et al., Appl. Phys. Lett. 81, 4625 (2002)
17. R. Calarco et al., Nano Lett. 5, 5 (2005).
18. V. Cimalla et al., phys. stat. sol. (a) 203, 59 (2006)
19. V. Cimalla, G. Ecke, M. Niebelschütz, O. Ambacher, R. Goldhahn, H. Lu, and W. J. Schaff, phys. stat. sol. (c) 2, 2254 (2005).
20. R. Calarco and M. Marso, Appl. Phys. A 87, 499 (2007).
21. D. Segev and C. G. Van de Walle, Surface Sci. Lett. 601, L15 (2007).