Scaling of the ductility with yield strength in nanostructured Cu/Cr multilayer films

Scripta Materialia

Volumn 63, Issue 1, 2010, Pages 101-104

  Zhang, J Y ^a   Zhang, X ^a   Liu, G ^a   Zhang, G J ^a   Sun, J ^a  

^a XI'AN JIAOTONG UNIVERSITY   (China)

Author keywords

Ductility; Modulation ratio; Nanostructured multilayers; Scaling relationship; Strength

Indexed keywords

CRITICAL STRESS; INTERFACE CONSTRAINTS; MACROSCOPIC FRACTURES; MODULATION PERIOD; MODULATION RATIO; NANO-STRUCTURED; NANOSTRUCTURED MULTILAYERS; SCALING RELATIONSHIP; SCALING RELATIONSHIPS; YIELD STRENGTH;

DUCTILITY; MODULATION; MULTILAYERS; YIELD STRESS;

MULTILAYER FILMS;

EID: 77951109780     PISSN: 13596462     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.scriptamat.2010.03.024     Document Type: Article

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