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Volumn 51, Issue 11, 2003, Pages 3157-3170

A model for dislocation behavior during deformation of Al/Al3Sc (fcc/L12) metallic multilayers

Author keywords

Dislocations; Hardness; Modeling; Multilayer thin films; Nanostructure

Indexed keywords

ALUMINUM COMPOUNDS; CRYSTAL MICROSTRUCTURE; DEFORMATION; DISLOCATIONS (CRYSTALS); HARDNESS; INTERFACES (MATERIALS);

EID: 0038519631     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1359-6454(03)00127-7     Document Type: Article
Times cited : (117)

References (37)
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  • 25
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    • Nix, W.D.1    Noble, D.B.2    Turlo, J.F.3
  • 28
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    • Dislocation-based models of stress-strain behaviour in multilayered thin films
    • R.C. Cammarata, M. Nastasi, E.P. Busso, OliverW.C., Boston, MA, USA, Warrendale (PA, USA): Materials Research Society
    • Anderson P.M., Kreidler E.R. Jr. Dislocation-based models of stress-strain behaviour in multilayered thin films. Cammarata R.C., Nastasi M., Busso E.P., Oliver W.C. Symposium 1-5 Dec 1997, Boston, MA, USA. vol. 505:1998;571 Materials Research Society, Warrendale (PA, USA).
    • (1998) Symposium 1-5 Dec 1997 , vol.505 , pp. 571
    • Anderson, P.M.1    Kreidler E.R., Jr.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.