A maximum in ductility and fracture toughness in nanostructured Cu/Cr multilayer films

Scripta Materialia

Volumn 62, Issue 6, 2010, Pages 333-336

  Zhang, J Y ^a   Liu, G ^a   Zhang, X ^a   Zhang, G J ^a   Sun, J ^a   Ma, E ^a,b  

^a XI'AN JIAOTONG UNIVERSITY   (China)

^b Johns Hopkins University   (United States)

Author keywords

Ductility; Nanostructured multilayers; Size effect; Toughness

Indexed keywords

CU LAYERS; MICROMECHANICAL MODEL; MODULATION PERIOD; MONOLITHIC FILMS; NANO-STRUCTURED; NANOSTRUCTURED MULTILAYERS; QUANTITATIVE ASSESSMENTS; SIZE EFFECT; SIZE EFFECTS; TENSILE DUCTILITY; THICKNESS EFFECT;

CHROMIUM; DUCTILITY; FRACTURE; FRACTURE TOUGHNESS; MULTILAYER FILMS;

MULTILAYERS;

EID: 73549114682     PISSN: 13596462     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.scriptamat.2009.10.030     Document Type: Article

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