Surface-energy-driven intermixing and its effect on the measurement of interface stress

Journal of Applied Physics

Volumn 87, Issue 6, 2000, Pages 2816-2820

  Clemens, B M ^a   Nix, W D ^a   Ramaswamy, V ^a  

^a Stanford University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001464723     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.372261     Document Type: Article

References (38)

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