Surface morphology of annealed polystyrene and poly(methyl methacrylate) thin film blends and bilayers

Macromolecules

Volumn 36, Issue 9, 2003, Pages 3307-3314

  Harris, Mark ^a   Appel, Guenter ^a   Ade, Harald ^a  

^a NORTH CAROLINA STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

PARTIAL ELECTRON YIELD; SURFACE SENSITIVITY; THERMODYNAMIC EQUILIBRIUM; TOTAL ELECTRON YIELD; WETTING LAYER; X RAY ABSORPTION FINE STRUCTURE;

ABSORPTION SPECTROSCOPY; ANNEALING; ATOMIC FORCE MICROSCOPY; HYDROPHILICITY; MORPHOLOGY; POLYMETHYL METHACRYLATES; POLYSTYRENES; SURFACES; THERMODYNAMIC PROPERTIES; THIN FILMS; WETTING;

POLYMER BLENDS;

EID: 0038779607     PISSN: 00249297     EISSN: None     Source Type: Journal    
DOI: 10.1021/ma0257043     Document Type: Article

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