Time-of-flight-secondary ion mass spectrometry and principal component analysis: Determination of structures of lamellar surfaces

Analytical Chemistry

Volumn 82, Issue 7, 2010, Pages 2661-2667

  Lau, Yiu Ting R ^a   Weng, Lu Tao ^a   Ng, Kai Mo ^a   Chan, Chi Ming ^a  

^a HONG KONG UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Hong Kong)

Author keywords

[No Author keywords available]

Indexed keywords

BISPHENOL A; CHEMICAL COMPOSITIONS; CONCENTRATION OF; DISCRIMINATING POWER; FLEXIBLE SEGMENTS; ION PEAKS; LAMELLAR SURFACE; POLYMER CHAINS; SEGMENT LENGTHS; STRUCTURAL CONFORMATIONS; STRUCTURAL VARIATIONS; TIME OF FLIGHT; TIME OF FLIGHT SECONDARY ION MASS SPECTROMETRY; TOF SIMS;

FLEXIBLE STRUCTURES; IONS; LAMELLAR STRUCTURES; MOLECULAR WEIGHT; PHENOLS; POLYMERS; SECONDARY EMISSION; SECONDARY ION MASS SPECTROMETRY; SPECTROMETRY;

PRINCIPAL COMPONENT ANALYSIS;

EID: 77950379886     PISSN: 00032700     EISSN: None     Source Type: Journal    
DOI: 10.1021/ac902280h     Document Type: Article

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