Positive secondary ion mass spectrum of poly(methyl methacrylate): A high mass resolution ToF-SIMS study

Surface and Interface Analysis

Volumn 29, Issue 5, 2000, Pages 303-309

  Briggs, David ^a,d   Fletcher, Ian W ^b   Gonçalves, Nancy M ^c  

^a UNIVERSITY OF NOTTINGHAM   (United Kingdom)

^b AKZO NOBEL CENTRAL RESEARCH   (Netherlands)

^c UNIVERSITY OF MINHO   (Portugal)

^d Siacon Consultants Ltd   (United Kingdom)

Author keywords

High mass resolution; Mass calibration; Poly(methyl acrylate); Poly(methyl methacrylate); ToF SIMS

Indexed keywords

EID: 0001289282     PISSN: 01422421     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1096-9918(200005)29:5<303::AID-SIA868>3.0.CO;2-5     Document Type: Article

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