Lamellar orientation on the surface of a polymer determined by ToF-SIMS and AFM

Applied Surface Science

Volumn 255, Issue 4, 2008, Pages 1001-1005

  Lau, Yiu Ting R ^a   Weng, Lu Tao ^a   Ng, Kai Mo ^a   Chan, Chi Ming ^a  

^a HONG KONG UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Hong Kong)

Author keywords

Edge on and flat on orientation; Ion image; Lamellar orientation; Polymer surface; ToF SIMS

Indexed keywords

IONS; ORGANIC POLYMERS; SECONDARY ION MASS SPECTROMETRY;

EDGE-ON AND FLAT-ON ORIENTATION; ION IMAGES; LAMELLAR ORIENTATIONS; POLYMER SURFACES; TOF SIMS;

POLYMER FILMS;

EID: 56449093054     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2008.05.114     Document Type: Article

References (18)

1. Hoffman J.D., and Miller R.L. Polymer 38 (1997) 3151
2. Peterlin A. Macromolecules 13 (1980) 1
3. Blackadder D.A., and Roberts T.L. Makromol. Chem. 126 (1969) 116
4. Fischer E.W. Pure Appl. Chem. 50 (1978) 1319
5. Furuhashi Y., Iwata T., Sikorski P., Atkins E., and Doi Y. Macromolecules 33 (2000) 9423
6. Nielsen A.S., Batchelder D.N., and Pyrz R. Polymer 43 (2002) 2671
7. Saito S., Moteki Y., Nakagawa M., Horii M., and Kitamaru R. Macromolecules 23 (1990) 3256
8. Briggs D. Surface Analysis of Polymers by XPS and Static SIMS (1998), Cambridge University Press, Cambridge pp. 119-155
9. Li L., Chan C.M., Ng K.M., Lei Y.G., and Weng L.T. Polymer 42 (2001) 6841
10. Vanden Eynde X., Weng L.T., and Bertrand P. Surf. Interface Anal. 25 (1997) 41
11. Cheung Z.L., Weng L.T., Chan C.M., Hou W.M., and Li L. Langmuir 21 (2005) 7968
12. Weng L.T., Smith T.L., Feng J.Y., and Chan C.M. Macromolecules 31 (1998) 928
13. Briggs D., Brewis D.M., Dahm R.H., and Fletcher I.W. Surf. Interface Anal. 35 (2003) 156
14. Kanchanasopa M., Manias E., and Runt J. Biomacromolecules 4 (2003) 1203
15. Wang Y., Chan C.M., Ng K.M., and Li L. Macromolecules 41 (2008) 2548
16. Delconte A., Bertrand P., Arys X., Jonas A., Wischerhoff E., Mayer B., and Laschewsky A. Surf. Sci. 366 (1996) 149
17. Balijepalli S., and Rutledge G.C. J. Chem. Phys. 109 (1998) 6523
18. Hu W.B. J. Chem. Phys. 115 (2001) 4395