ToF-SIMS study of alternate polyelectrolyte thin films: Chemical surface characterization and molecular secondary ions sampling depth

Surface Science

Volumn 366, Issue 1, 1996, Pages 149-165

  Delcorte, A ^a   Bertrand, P ^a   Arys, X ^a   Jonas, A ^a   Wischerhoff, E ^a   Mayer, B ^a   Laschewsky, A ^a  

^a UNIVERSITÉ CATHOLIQUE DE LOUVAIN   (Belgium)

Author keywords

Adhesion; Coatings; Ion emission; Polyelectrolyte; Secondary Ion Mass Spectroscopy; Self assembly; X Ray Photoelectron Spectroscopy; X Ray Reflectivity

Indexed keywords

ADHESION; ATOMIC FORCE MICROSCOPY; CHARACTERIZATION; COATINGS; POLYELECTROLYTES; SECONDARY ION MASS SPECTROMETRY; SURFACES; SYNTHESIS (CHEMICAL); THICKNESS MEASUREMENT; X RAY PHOTOELECTRON SPECTROSCOPY;

CHEMICAL SURFACE CHARACTERIZATION; ION EMISSION; MOLECULAR SECONDARY ION SAMPLING DEPTH; POLYELECTROLYTE THIN FILMS; SELF ASSEMBLY; X RAY REFLECTIVITY;

THIN FILMS;

EID: 0030270906     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/0039-6028(96)00779-0     Document Type: Article

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