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Volumn 312, Issue 9, 2010, Pages 1491-1495
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Substrate temperature dependence of ZnTe epilayers grown on GaAs(0 0 1) by molecular beam epitaxy
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Author keywords
A1. Atomic force microscopy; A1. Molecular beam epitaxy; A1. Reflection high energy electron diffraction; B1. Zinc compounds; B2. Semiconducting II VI materials
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Indexed keywords
A1. ATOMIC FORCE MICROSCOPY;
A1. REFLECTION HIGH-ENERGY ELECTRON DIFFRACTION;
B2. SEMICONDUCTING II-VI MATERIALS;
BEAM EQUIVALENT PRESSURE;
EPILAYERS GROWN;
GAAS;
GROWTH MODES;
HIGHER TEMPERATURES;
IN-SITU;
ROOT MEAN SQUARE ROUGHNESS;
SEMICONDUCTING II-VI MATERIALS;
STICKING COEFFICIENTS;
SUBSTRATE TEMPERATURE;
SUBSTRATE TEMPERATURE DEPENDENCE;
THREE-DIMENSIONAL (3D);
X RAY ROCKING CURVE;
ZNTE THIN FILMS;
ATOMIC FORCE MICROSCOPY;
DESORPTION;
ELECTRON DIFFRACTION;
EPILAYERS;
EPITAXIAL GROWTH;
GALLIUM ALLOYS;
GALLIUM ARSENIDE;
HIGH ENERGY PHYSICS;
MOLECULAR BEAM EPITAXY;
MOLECULAR BEAMS;
REFLECTION;
REFLECTION HIGH ENERGY ELECTRON DIFFRACTION;
SEMICONDUCTING GALLIUM;
SEMICONDUCTOR GROWTH;
SEMICONDUCTOR QUANTUM WIRES;
SUBSTRATES;
THREE DIMENSIONAL;
TWO DIMENSIONAL;
ZINC;
ZINC COMPOUNDS;
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EID: 77949913117
PISSN: 00220248
EISSN: None
Source Type: Journal
DOI: 10.1016/j.jcrysgro.2010.01.032 Document Type: Article |
Times cited : (9)
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References (17)
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