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Volumn 312, Issue 9, 2010, Pages 1491-1495

Substrate temperature dependence of ZnTe epilayers grown on GaAs(0 0 1) by molecular beam epitaxy

Author keywords

A1. Atomic force microscopy; A1. Molecular beam epitaxy; A1. Reflection high energy electron diffraction; B1. Zinc compounds; B2. Semiconducting II VI materials

Indexed keywords

A1. ATOMIC FORCE MICROSCOPY; A1. REFLECTION HIGH-ENERGY ELECTRON DIFFRACTION; B2. SEMICONDUCTING II-VI MATERIALS; BEAM EQUIVALENT PRESSURE; EPILAYERS GROWN; GAAS; GROWTH MODES; HIGHER TEMPERATURES; IN-SITU; ROOT MEAN SQUARE ROUGHNESS; SEMICONDUCTING II-VI MATERIALS; STICKING COEFFICIENTS; SUBSTRATE TEMPERATURE; SUBSTRATE TEMPERATURE DEPENDENCE; THREE-DIMENSIONAL (3D); X RAY ROCKING CURVE; ZNTE THIN FILMS;

EID: 77949913117     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jcrysgro.2010.01.032     Document Type: Article
Times cited : (9)

References (17)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.