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Volumn 83, Issue 12, 2009, Pages 1485-1488
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The effect of substrate temperature on the structural, optical and electrical properties of vacuum deposited ZnTe thin films
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Author keywords
Hall effect; Substrate temperature; Thin film; Vacuum deposition; XRD; Zinc telluride
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Indexed keywords
CUBIC STRUCTURE;
ELECTRICAL CONDUCTIVITY;
GLASS SUBSTRATES;
OPTICAL AND ELECTRICAL PROPERTIES;
OPTICAL BAND GAP ENERGY;
ROOM TEMPERATURE;
STOICHIOMETRIC FILMS;
SUBSTRATE TEMPERATURE;
THERMAL ACTIVATION ENERGIES;
XRD;
ZINC TELLURIDE;
ZINC TELLURIDES;
ZNTE THIN FILMS;
ACTIVATION ENERGY;
CARRIER CONCENTRATION;
CARRIER MOBILITY;
DEPOSITION;
ELECTRIC CONDUCTIVITY;
GYRATORS;
HALL EFFECT;
MAGNETIC FIELD EFFECTS;
OPTICAL PROPERTIES;
SEMICONDUCTING ZINC COMPOUNDS;
TELLURIUM;
TELLURIUM COMPOUNDS;
THERMAL EFFECTS;
THIN FILM DEVICES;
THIN FILMS;
VACUUM;
VACUUM DEPOSITION;
X RAY DIFFRACTION;
X RAY DIFFRACTION ANALYSIS;
ZINC;
SUBSTRATES;
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EID: 67650716319
PISSN: 0042207X
EISSN: None
Source Type: Journal
DOI: 10.1016/j.vacuum.2009.06.047 Document Type: Article |
Times cited : (42)
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References (14)
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