-
2
-
-
33644787718
-
Structure and phase transformation behavior of electroless Ni-P composite coatings
-
Jun.
-
J. N. Balaraju, T. S. N. Sankara Narayanan, and S. K. Seshadri, "Structure and phase transformation behavior of electroless Ni-P composite coatings," Mater. Res. Bull., vol.41, pp. 847-860, Jun. 2006.
-
(2006)
Mater. Res. Bull.
, vol.41
, pp. 847-860
-
-
Balaraju, J.N.1
Sankara Narayanan, T.S.N.2
Seshadri, S.K.3
-
3
-
-
33749470881
-
Effect of accelerators and stabilizers on the formation and characteristics of electroless Ni-P deposits
-
Sep.
-
I. Baskaran, T. S. N. Sankara Narayanan, and A. Stephen, "Effect of accelerators and stabilizers on the formation and characteristics of electroless Ni-P deposits," Mater. Chem. Phys., vol.99, no.1, pp. 117- 126, Sep. 2006.
-
(2006)
Mater. Chem. Phys.
, vol.99
, Issue.1
, pp. 117-126
-
-
Baskaran, I.1
Sankara Narayanan, T.S.N.2
Stephen, A.3
-
4
-
-
33646402336
-
Temperature and pH dependence of the electroless Ni-P deposition on silicon
-
Jul.
-
W. L. Liu, S. H. Hsieh, T. K. Tsai, W. J. Chen, and S. S. Wu, "Temperature and pH dependence of the electroless Ni-P deposition on silicon," Thin Solid Films, vol.510, nos. 1-2, pp. 102-106, Jul. 2006.
-
(2006)
Thin Solid Films
, vol.510
, Issue.1-2
, pp. 102-106
-
-
Liu, W.L.1
Hsieh, S.H.2
Tsai, T.K.3
Chen, W.J.4
Wu, S.S.5
-
5
-
-
31144453851
-
Qualitative electroless Ni/Au plating considerations for the solder mask on top of sequential build-up layers
-
Feb.
-
S. Siau, A. Vervaet, L. Degrendele, J. D. Baets, and A. V. Calster, "Qualitative electroless Ni/Au plating considerations for the solder mask on top of sequential build-up layers," Appl. Surf. Sci., vol.252, no.8, pp. 2717-2740, Feb. 2006.
-
(2006)
Appl. Surf. Sci.
, vol.252
, Issue.8
, pp. 2717-2740
-
-
Siau, S.1
Vervaet, A.2
Degrendele, L.3
Baets, J.D.4
Calster, A.V.5
-
6
-
-
0028368281
-
Electroless metal deposition as a useful tool for microelectronics and microstructures
-
Jan.
-
E. Queau, G. Stremsdoefer, J. R. Martin, and P. Clechet, "Electroless metal deposition as a useful tool for microelectronics and microstructures," Plat. Surf. Finish, vol.81, pp. 65-69, Jan. 1994.
-
(1994)
Plat. Surf. Finish
, vol.81
, pp. 65-69
-
-
Queau, E.1
Stremsdoefer, G.2
Martin, J.R.3
Clechet, P.4
-
7
-
-
0025567375
-
Electroless deposition of bumps for TAB technology
-
New York, NY
-
J. Simon, E. Zakel, and H. Reichl, "Electroless deposition of bumps for TAB technology," in Proc. 40th Electron. Compon. Technol. Conf., New York, NY, 1990, pp. 412-417.
-
(1990)
Proc. 40th Electron. Compon. Technol. Conf.
, pp. 412-417
-
-
Simon, J.1
Zakel, E.2
Reichl, H.3
-
8
-
-
0035305291
-
Surface properties and solderability behavior of nickel-phosphorus and nickel-boron deposited by electroless plating
-
Apr.
-
Y. M. Chow, W. M. Lau, and Z. S. Karim, "Surface properties and solderability behavior of nickel-phosphorus and nickel-boron deposited by electroless plating," Surf. Interface Anal., vol.31, no.4, pp. 321-327, Apr. 2001.
-
(2001)
Surf. Interface Anal.
, vol.31
, Issue.4
, pp. 321-327
-
-
Chow, Y.M.1
Lau, W.M.2
Karim, Z.S.3
-
9
-
-
33751233234
-
Phase transformation of Ni-B, Ni-P diffusion barrier deposited electrolessly on Cu interconnect
-
Dec.
-
J. W. Choi, G. H. Hwang, W. K. Han, and S. G. Kang, "Phase transformation of Ni-B, Ni-P diffusion barrier deposited electrolessly on Cu interconnect," Appl. Surf. Sci., vol.253, no.4, pp. 2171-2178, Dec. 2006.
-
(2006)
Appl. Surf. Sci.
, vol.253
, Issue.4
, pp. 2171-2178
-
-
Choi, J.W.1
Hwang, G.H.2
Han, W.K.3
Kang, S.G.4
-
10
-
-
33745085903
-
Formation of electroless Ni-B coatings using low temperature bath and evaluation of their characteristic properties
-
Aug.
-
I. Baskaran, R. S. Kumar, T. S. N. Sankara Narayanan, and A. Stephen, "Formation of electroless Ni-B coatings using low temperature bath and evaluation of their characteristic properties," Surf. Coat. Tech., vol.200, no.24, pp. 6888-6894, Aug. 2006.
-
(2006)
Surf. Coat. Tech.
, vol.200
, Issue.24
, pp. 6888-6894
-
-
Baskaran, I.1
Kumar, R.S.2
Sankara Narayanan, T.S.N.3
Stephen, A.4
-
11
-
-
77949567325
-
Chip-level interconnects: Wire bonds and solder bumps
-
New York: McGraw-Hill
-
J. H. Lau, "Chip-level interconnects: Wire bonds and solder bumps," in Low Cost Flip Chip Technologies for DCA, WLCSP, and PBGA Assemblies. New York: McGraw-Hill, 2000, pp. 43-50.
-
(2000)
Low Cost Flip Chip Technologies for DCA, WLCSP, and PBGA Assemblies
, pp. 43-50
-
-
Lau, J.H.1
-
12
-
-
33644687001
-
Effect of isothermal aging on the interfacial reactions between Sn-0.4Cu solder and Cu substrate with or without ENIG plating layer
-
Apr.
-
J. W. Yoon and S. B. Jung, "Effect of isothermal aging on the interfacial reactions between Sn-0.4Cu solder and Cu substrate with or without ENIG plating layer," Surf. Coat. Tech., vol.200, nos. 14-15, pp. 4440- 4447, Apr. 2006.
-
(2006)
Surf. Coat. Tech.
, vol.200
, Issue.14-15
, pp. 4440-4447
-
-
Yoon, J.W.1
Jung, S.B.2
-
13
-
-
50649110979
-
Effect of boron content in electroless Ni-B layer on plating layer properties and soldering characteristics with Sn-Ag solder
-
Oct.
-
J. W. Yoon, J. M. Koo, J. W. Kim, S. S. Ha, B. I. Noh, C. Y. Lee, J. H. Park, C. C. Shur, and S. B. Jung, "Effect of boron content in electroless Ni-B layer on plating layer properties and soldering characteristics with Sn-Ag solder," J. Alloys Comp., vol.466, nos. 1-2, pp. 73-79, Oct. 2008.
-
(2008)
J. Alloys Comp.
, vol.466
, Issue.1-2
, pp. 73-79
-
-
Yoon, J.W.1
Koo, J.M.2
Kim, J.W.3
Ha, S.S.4
Noh, B.I.5
Lee, C.Y.6
Park, J.H.7
Shur, C.C.8
Jung, S.B.9
-
14
-
-
0021729454
-
Operation and use of sodiumborohydride- reduced electroless nickel
-
Dec.
-
R. N. Duncan and T. L. Arney, "Operation and use of sodiumborohydride- reduced electroless nickel," Plat. Surf. Finish, vol.71, no.12, pp. 49-54, Dec. 1984.
-
(1984)
Plat. Surf. Finish
, vol.71
, Issue.12
, pp. 49-54
-
-
Duncan, R.N.1
Arney, T.L.2
-
15
-
-
0036631011
-
Ni-B electroless plating as cap layer for Ag multi-level metallization
-
Jul.
-
M. Tsujimura, H. Inoue, H. Ezawa, M. Miyata, and M. Ota, "Ni-B electroless plating as cap layer for Ag multi-level metallization," Mater. Trans., vol.43, no.7, pp. 1615-1620, Jul. 2002.
-
(2002)
Mater. Trans.
, vol.43
, Issue.7
, pp. 1615-1620
-
-
Tsujimura, M.1
Inoue, H.2
Ezawa, H.3
Miyata, M.4
Ota, M.5
-
16
-
-
34548445450
-
Morphology, thermal stability and solderability of electroless nickel-phosphorus plating layer
-
Jan.
-
J. W. Yoon, H. S. Chun, H. B. Kang, M. H. Park, C. W. Yang, H. J. Lee, and S. B. Jung, "Morphology, thermal stability and solderability of electroless nickel-phosphorus plating layer," Surf. Rev. Lett., vol.14, no.4, pp. 827-832, Jan. 2007.
-
(2007)
Surf. Rev. Lett.
, vol.14
, Issue.4
, pp. 827-832
-
-
Yoon, J.W.1
Chun, H.S.2
Kang, H.B.3
Park, M.H.4
Yang, C.W.5
Lee, H.J.6
Jung, S.B.7
-
17
-
-
2442424148
-
IMC growth and shear strength of Sn-Ag-Bi-In/Au/Ni/Cu BGA joints during aging
-
Mar.
-
J. W. Yoon, S. W. Kim, and S. B. Jung, "IMC growth and shear strength of Sn-Ag-Bi-In/Au/Ni/Cu BGA joints during aging," Mater. Trans., vol.45, pp. 727-733, Mar. 2004.
-
(2004)
Mater. Trans.
, vol.45
, pp. 727-733
-
-
Yoon, J.W.1
Kim, S.W.2
Jung, S.B.3
-
18
-
-
33645135794
-
Isothermal aging effects on the microstructure and solder bump shear strength of eutectic Sn37Pb and Sn3.5Ag solders
-
May-Jun.
-
W. M. Chen, P. McCloskey, and S. C. O'Mathuna, "Isothermal aging effects on the microstructure and solder bump shear strength of eutectic Sn37Pb and Sn3.5Ag solders," Microelectron. Reliab., vol.46, nos. 5-6, pp. 896-904, May-Jun. 2006.
-
(2006)
Microelectron. Reliab.
, vol.46
, Issue.5-6
, pp. 896-904
-
-
Chen, W.M.1
Mc Closkey, P.2
O'Mathuna, S.C.3
-
19
-
-
0037076832
-
Six cases of reliability study of Pb-free solder joints in electronic packaging technology
-
Jun.
-
K. Zeng and K. N. Tu, "Six cases of reliability study of Pb-free solder joints in electronic packaging technology," Mater. Sci. Eng., R38, pp. 55-105, Jun. 2002.
-
(2002)
Mater. Sci. Eng.
, vol.R38
, pp. 55-105
-
-
Zeng, K.1
Tu, K.N.2
-
20
-
-
0346846606
-
Growth of an intermetallic compound layer with Sn-3.5Ag-5Bi solder on Cu and Ni-P/Cu during aging treatment
-
Nov.
-
J. W. Yoon, C. B. Lee, and S. B. Jung, "Growth of an intermetallic compound layer with Sn-3.5Ag-5Bi solder on Cu and Ni-P/Cu during aging treatment," J. Electron. Mater., vol.32, no.11, pp. 1195-1202, Nov. 2003.
-
(2003)
J. Electron. Mater.
, vol.32
, Issue.11
, pp. 1195-1202
-
-
Yoon, J.W.1
Lee, C.B.2
Jung, S.B.3
-
21
-
-
1842554859
-
Solid state interfacial reaction of Sn-37Pb and Sn-3.5Ag solders with Ni-P under bump metallization
-
Apr.
-
M. He, Z. Chen, and G. Qi, "Solid state interfacial reaction of Sn-37Pb and Sn-3.5Ag solders with Ni-P under bump metallization," Acta Mater., vol.52, pp. 2047-2056, Apr. 2004.
-
(2004)
Acta Mater.
, vol.52
, pp. 2047-2056
-
-
He, M.1
Chen, Z.2
Qi, G.3
-
22
-
-
37249087939
-
Characterization of interfacial reaction layers formed between Sn-3.5Ag solder and electroless Ni-immersion Au-plated Cu substrates
-
Jan.
-
H. B. Kang, J. H. Bae, J. W. Lee, M. H. Park, J. W. Yoon, S. B. Jung, and C. W. Yang, "Characterization of interfacial reaction layers formed between Sn-3.5Ag solder and electroless Ni-immersion Au-plated Cu substrates," J. Electron. Mater., vol.37, pp. 84-89, Jan. 2008.
-
(2008)
J. Electron. Mater.
, vol.37
, pp. 84-89
-
-
Kang, H.B.1
Bae, J.H.2
Lee, J.W.3
Park, M.H.4
Yoon, J.W.5
Jung, S.B.6
Yang, C.W.7
-
23
-
-
33750369203
-
Suppressing Ni-Sn-P growth in SnAgCu/Ni-P solder joints
-
Jan.
-
Y. C. Lin, T. Y. Shih, S. K. Tien, and J. G. Duh, "Suppressing Ni-Sn-P growth in SnAgCu/Ni-P solder joints," Scripta Mater., vol.56, no.1, pp. 49-52, Jan. 2007.
-
(2007)
Scripta Mater.
, vol.56
, Issue.1
, pp. 49-52
-
-
Lin, Y.C.1
Shih, T.Y.2
Tien, S.K.3
Duh, J.G.4
-
24
-
-
0032614004
-
Solder reaction-assisted crystallization of electroless Ni-P under bump metallization in low-cost flip-chip technology
-
Jun.
-
J. W. Jang, P. G. Kim, K. N. Tu, D. R. Frear, and P. Thompson, "Solder reaction-assisted crystallization of electroless Ni-P under bump metallization in low-cost flip-chip technology," J. Appl. Phys., vol.85, no.12, pp. 8456-8463, Jun. 1999.
-
(1999)
J. Appl. Phys.
, vol.85
, Issue.12
, pp. 8456-8463
-
-
Jang, J.W.1
Kim, P.G.2
Tu, K.N.3
Frear, D.R.4
Thompson, P.5
-
25
-
-
34548856491
-
Characteristic evaluation of electroless nickel-phosphorus deposits with different phosphorus contents
-
Nov.
-
J.W. Yoon, J. H. Park, C. C. Shur, and S. B. Jung, "Characteristic evaluation of electroless nickel-phosphorus deposits with different phosphorus contents," Microelectron. Eng., vol.84, no.11, pp. 2552-2557, Nov. 2007.
-
(2007)
Microelectron. Eng.
, vol.84
, Issue.11
, pp. 2552-2557
-
-
Yoon, J.W.1
Park, J.H.2
Shur, C.C.3
Jung, S.B.4
-
26
-
-
0036642259
-
Reliability study of the electroless Ni-P layer against solder alloy
-
Jul.
-
M. O. Alam, Y. C. Chan, and K. C. Hung, "Reliability study of the electroless Ni-P layer against solder alloy," Microelectron. Reliab., vol.42, no.7, pp. 1065-1073, Jul. 2002.
-
(2002)
Microelectron. Reliab.
, vol.42
, Issue.7
, pp. 1065-1073
-
-
Alam, M.O.1
Chan, Y.C.2
Hung, K.C.3
-
27
-
-
0036543305
-
Effect of surface finishes on ball shear strength in BGA joints with Sn-3.5 mass%Ag solder
-
Apr.
-
C. B. Lee, I. Y. Lee, S. B. Jung, and C. C. Shur, "Effect of surface finishes on ball shear strength in BGA joints with Sn-3.5 mass%Ag solder," Mater. Trans., vol.43, no.4, pp. 751-756, Apr. 2002.
-
(2002)
Mater. Trans.
, vol.43
, Issue.4
, pp. 751-756
-
-
Lee, C.B.1
Lee, I.Y.2
Jung, S.B.3
Shur, C.C.4
|