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Journal of Applied Physics

Volumn 107, Issue 4, 2010, Pages

Influence of traps on transient electric field and mobility evaluation in organic field-effect transistors

(4) Manaka, Takaaki a Liu, Fei b Weis, Martin a Iwamoto, Mitsumasa a

a TOKYO INSTITUTE OF TECHNOLOGY (Japan)

b TSINGHUA UNIVERSITY (China)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTATIONAL SIMULATION; CONDUCTIVE CHANNELS; EXPERIMENTAL EVIDENCE; HOLE TRANSPORTS; METHYL METHACRYLATES; OPTICAL SECOND HARMONIC GENERATION; PENTACENES; SIMPLE APPROACH; TIME-RESOLVED; TRANSIENT ELECTRIC FIELDS; TRAP DENSITY; TRAPPED CARRIERS;

ELECTRIC FIELD MEASUREMENT; ELECTRIC FIELDS; HOLE MOBILITY; INDUSTRIAL MANAGEMENT; ORGANIC FIELD EFFECT TRANSISTORS; SILICON COMPOUNDS;

FIELD EFFECT TRANSISTORS;

EID: 77749283610 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.3285503 Document Type: Article

Times cited : (28)

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