Mobility measurement based on visualized electric field migration in organic field-effect transistors

Applied Physics Express

Volumn 2, Issue 6, 2009, Pages

  Manaka, Takaaki ^a   Liu, Fei ^b   Weis, Martin ^a   Iwamoto, Mitsumasa ^a  

^a TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

^b TSINGHUA UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTATIONAL SIMULATION; MOBILITY MEASUREMENTS; OPTICAL SECOND HARMONIC GENERATION; ORGANIC FIELD-EFFECT TRANSISTORS; TIME-RESOLVED; TRANSFER CHARACTERISTICS; TRANSIENT ELECTRIC FIELDS;

CARRIER MOBILITY; ELECTRIC FIELDS;

FIELD EFFECT TRANSISTORS;

EID: 68049114768     PISSN: 18820778     EISSN: 18820786     Source Type: Journal    
DOI: 10.1143/APEX.2.061501     Document Type: Article

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