Probing material properties of polymeric surface layers with tapping mode AFM: Which cantilever spring constant, tapping amplitude and amplitude set point gives good image contrast and minimal surface damage?

Ultramicroscopy

Volumn 110, Issue 4, 2010, Pages 313-319

  Thormann, Esben ^a   Pettersson, Torbjörn ^a   Kettle, John ^b   Claesson, Per M ^a  

^a ROYAL INSTITUTE OF TECHNOLOGY   (Sweden)

^b KCL   (Finland)

Author keywords

AFM; Amplitude; Energy dissipation; Phase; Set point; Spring constant; Tapping mode

Indexed keywords

AFM; AFM IMAGING; CANTILEVER SPRINGS; ELASTIC PROPERTIES; IMAGE CONTRASTS; LOW-AMPLITUDE; MATERIAL PROPERTY; MINIMAL SURFACES; OSCILLATORY MOTION; PHASE IMAGE; PHASE RESPONSE; POLYMERIC SURFACES; SET-POINT; SOFT SURFACE; SPRING CONSTANTS; SURFACE DAMAGES; SURFACE LAYERS; SURFACE SEPARATION; TAPPING MODES;

ATOMIC FORCE MICROSCOPY; ELECTRON ENERGY LOSS SPECTROSCOPY; ENERGY DISSIPATION; ENERGY DISSIPATORS; NANOCANTILEVERS;

SURFACES;

POLYMER;

ARTICLE; ATOMIC FORCE MICROSCOPY; CONTROLLED STUDY; IMAGE ANALYSIS; INTERMETHOD COMPARISON; MATERIAL STATE; MOLECULAR PROBE; OSCILLATION; PHYSICAL CHEMISTRY; PROCESS OPTIMIZATION; SURFACE PROPERTY;

EID: 77649188563     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2010.01.002     Document Type: Article

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