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Volumn 79, Issue 2, 2000, Pages 1107-1118
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Atomic force microscope image contrast mechanisms on supported lipid bilayers
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Author keywords
[No Author keywords available]
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Indexed keywords
LIPID;
ARTICLE;
ATOMIC FORCE MICROSCOPY;
CONTRAST ENHANCEMENT;
FORCE;
IMAGING;
LIPID BILAYER;
MEASUREMENT;
SURFACE PROPERTY;
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EID: 0033897190
PISSN: 00063495
EISSN: None
Source Type: Journal
DOI: 10.1016/S0006-3495(00)76364-8 Document Type: Article |
Times cited : (115)
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References (8)
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