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Volumn 43, Issue 8, 2010, Pages

Damage and microstructure evolution in GaN under Au ion irradiation

Author keywords

[No Author keywords available]

Indexed keywords

GALLIUM NITRIDE; III-V SEMICONDUCTORS; ION BEAM LITHOGRAPHY; ION BEAMS; ION BOMBARDMENT; IONS; ITERATIVE METHODS; MICROSTRUCTURE; NITROGEN; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SECONDARY ION MASS SPECTROMETRY; TRANSMISSION ELECTRON MICROSCOPY;

EID: 77149163459     PISSN: 00223727     EISSN: 13616463     Source Type: Journal    
DOI: 10.1088/0022-3727/43/8/085303     Document Type: Article
Times cited : (45)

References (35)
  • 22
    • 59349086660 scopus 로고    scopus 로고
    • Moll S, Thomé L, Vincent L, Garrido F, Sattonnay G, Thomé T, Jagielski J and Costantini J-M 2009 J. Appl. Phys. 105 023512
    • (2009) J. Appl. Phys. , vol.105 , pp. 023512
    • Moll, S.T.1
  • 25
    • 0003412161 scopus 로고    scopus 로고
    • (Chester, MD: SRIM Co) (as well as the orginal book of Ziegler J F, Biersack J P and Littmark U 1985 (Oxford: Pergamon))
    • Ziegler J F, Biersack J P and Ziegler M D 2008 The Stopping and Range of Ions in Solids (Chester, MD: SRIM Co) (as well as the orginal book of Ziegler J F, Biersack J P and Littmark U 1985 (Oxford: Pergamon))
    • (2008) The Stopping and Range of Ions in Solids
    • Ziegler, J.F.1    Biersack, J.P.2    Ziegler, M.D.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.