Electrical width determination of silicon nanowires prepared by using the top-down method

Journal of the Korean Physical Society

Volumn 55, Issue 6, 2009, Pages 2486-2490

  Lee, S J ^a  

^a Hanyang University   (South Korea)

Author keywords

Low dimensional transport; Semiconductor nanowire

Indexed keywords

EID: 76549104068     PISSN: 03744884     EISSN: None     Source Type: Journal    
DOI: 10.3938/jkps.55.2486     Document Type: Article

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