SCOPUS 정보 검색 플랫폼

Thin Solid Films

Volumn 518, Issue 9, 2010, Pages 2437-2441

Full-Band Monte Carlo investigation of hole mobilities in SiGe, SiC and SiGeC alloys

(5) Michaillat, M a,b Rideau, D a Aniel, F b Tavernier, C a Jaouen, H a

a STMICROELECTRONICS (France)

b UNIVERSITÉ PARIS SACLAY (France)

Author keywords

Hole; Mobility; Monte Carlo; SiGe; SiGeC

Indexed keywords

DOPING CONCENTRATION; DOPING EFFECTS; FULL-BAND MONTE CARLO; GE CONTENT; HOLE DRIFT-MOBILITY; HOLE TRANSPORTS; IMPURITY SCATTERING; IN-PLANE; MOBILITY; MOMENTUM RELAXATION; MONTE CARLO; NEW ALLOYS; OUT-OF-PLANE; POTENTIAL PARAMETERS; SCATTERING STRENGTH; SIGEC ALLOY; STRAINED-SI; WAVE THEORY;

CERIUM ALLOYS; CRYSTAL IMPURITIES; GERMANIUM; HOLE CONCENTRATION; HOLE MOBILITY; MONTE CARLO METHODS; SCATTERING; SILICON; SILICON CARBIDE; TRANSPORT PROPERTIES;

SILICON ALLOYS;

EID: 76049088639 PISSN: 00406090 EISSN: None Source Type: Journal
DOI: 10.1016/j.tsf.2009.10.147 Document Type: Article

Times cited : (10)

References (15)

1
- 13244276339
- Decoutere S., and Sibaja-Hernandez A. Mat. Sci. Semicon. Proc. 8 (2005) 283
- (2005) Mat. Sci. Semicon. Proc. , vol.8 , pp. 283
- Decoutere, S.¹ Sibaja-Hernandez, A.²

2
- 33751538015
- Rideau D., Feraille M., Ciampolini L., Minondo M., Tavernier C., and Jaouen H. Phys. Rev. B 74 (2006) 195208
- (2006) Phys. Rev. B , vol.74 , pp. 195208
- Rideau, D.¹ Feraille, M.² Ciampolini, L.³ Minondo, M.⁴ Tavernier, C.⁵ Jaouen, H.⁶

3
- 35949009958
- Fischetti M.V., and Laux S.E. Phys. Rev. B 38 (1988) 9721
- (1988) Phys. Rev. B , vol.38 , pp. 9721
- Fischetti, M.V.¹ Laux, S.E.²

4
- 0000840155
- Bufler F.M., and Meinerzhagen B. J. Appl. Phys. 84 (1998) 5597
- (1998) J. Appl. Phys. , vol.84 , pp. 5597
- Bufler, F.M.¹ Meinerzhagen, B.²

5
- 0001038893
- Fischetti M.V., and Laux S.E. J. Appl. Phys. 80 (1996) 2234
- (1996) J. Appl. Phys. , vol.80 , pp. 2234
- Fischetti, M.V.¹ Laux, S.E.²

6
- 0001467871
- Busch G., and Vogt O. Helv. Phys. Acta 33 (1960) 437
- (1960) Helv. Phys. Acta , vol.33 , pp. 437
- Busch, G.¹ Vogt, O.²

7
- 0000190368
- Gaworzewski P., Tittelbach-Helmrich K., and Penner U. J. Appl. Phys. 83 (1998) 5258
- (1998) J. Appl. Phys. , vol.83 , pp. 5258
- Gaworzewski, P.¹ Tittelbach-Helmrich, K.² Penner, U.³

8
- 0032312518
- Duschl R., Seeberger H., and Eberl K. Thin Solid Films 336 (1998) 336
- (1998) Thin Solid Films , vol.336 , pp. 336
- Duschl, R.¹ Seeberger, H.² Eberl, K.³

9
- 0034295825
- Bufler F.M., Schenk A., and Fichtner W. IEEE Trans. Electron Devices 47 (2000) 1891
- (2000) IEEE Trans. Electron Devices , vol.47 , pp. 1891
- Bufler, F.M.¹ Schenk, A.² Fichtner, W.³

10
- 0007974018
- Bufler F.M., Yoder P.D., and Fichtner W. Proc. SISPAD (1999) 31
- (1999) Proc. SISPAD , pp. 31
- Bufler, F.M.¹ Yoder, P.D.² Fichtner, W.³

11
- 0346749990
- Meyer J.R., and Bartoli F.J. Phys. Rev. B 23 (1981) 5413
- (1981) Phys. Rev. B , vol.23 , pp. 5413
- Meyer, J.R.¹ Bartoli, F.J.²

12
- 36449007693
- Kay L.E., and Tang T.-W. J. Appl. Phys. 70 (1991) 1475
- (1991) J. Appl. Phys. , vol.70 , pp. 1475
- Kay, L.E.¹ Tang, T.-W.²

13
- 0022152949
- Lugli P., and Ferry D. IEEE Trans. Electron. Devices 32 (1985) 2431
- (1985) IEEE Trans. Electron. Devices , vol.32 , pp. 2431
- Lugli, P.¹ Ferry, D.²

14
- 0009509593
- Caughey D.M., and Thomas R.E. Proc. IEEE 55 (1967) 2192
- (1967) Proc. IEEE , vol.55 , pp. 2192
- Caughey, D.M.¹ Thomas, R.E.²

15
- 1142292381
- Palankovski V., Röhrer G., Grasser T., Smirnov S., Kosina H., and Selberherr S. Appl. Surf. Sci. 224 (2004) 361
- (2004) Appl. Surf. Sci. , vol.224 , pp. 361
- Palankovski, V.¹ Röhrer, G.² Grasser, T.³ Smirnov, S.⁴ Kosina, H.⁵ Selberherr, S.⁶

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.