Hole transport in strained Si1-xGex alloys on Si1-yGey substrates

Journal of Applied Physics

Volumn 84, Issue 10, 1998, Pages 5597-5602

  Bufler, F M ^a,b   Meinerzhagen, B ^a  

^a UNIVERSITY OF BREMEN   (Germany)

^b ETH ZURICH   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000840155     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.368605     Document Type: Article

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