Phase mask based interferometer: Operation principle, performance, and application to thermoelastic phenomena

Review of Scientific Instruments

Volumn 75, Issue 9, 2004, Pages 2906-2920

  Glorieux, G ^a,c   Beers, J D ^b   Bentefour, E H ^a   Van De Rostyne, K ^a   Nelson, Keith A ^b  

^a UNIVERSITY OF LEUVEN   (Belgium)

^b MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

^c Fonds Wetenschappelijk Onderz V ^*  (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

FRINGE PATTERN; OPTICAL PATH LENGTH; PHASE DRIFT; PHASE MASK;

ACOUSTIC WAVES; CHROMIUM; IMAGING TECHNIQUES; INTERFEROMETERS; OPTICAL DEVICES; OPTICAL RESOLVING POWER; REFRACTIVE INDEX; SCANNING; STRAIN; THERMOELASTICITY;

DIFFRACTIVE OPTICS;

EID: 7544250037     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1781386     Document Type: Article

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