Surface acoustic wave depth profiling of elastically inhomogeneous materials

Journal of Applied Physics

Volumn 88, Issue 7, 2000, Pages 4394-4400

  Glorieux, Christ ^a   Gao, Weimin ^a   Kruger, Silvio Elton ^b   Van De Rostyne, Kris ^a   Lauriks, Walter ^a   Thoen, Jan ^a  

^a UNIVERSITY OF LEUVEN   (Belgium)

^b NONE

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001349218     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1290457     Document Type: Article

References (13)

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