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Optics Communications

Volumn 204, Issue 1-6, 2002, Pages 33-43

Optical heterodyne profilometer to scan irregularities in reflective objects

(4) Baltazar, Rosario a Solano, C a Martinez Ponce G a Camacho P, Alma A a

a CENTRO DE INVESTIGACIONES EN ÓPTICA (Mexico)

Author keywords

[No Author keywords available]

Indexed keywords

BACKSCATTERING; COMPUTER SIMULATION; INTERFEROMETERS; LASER PULSES; LIGHT REFLECTION; MATHEMATICAL MODELS; ROUGHNESS MEASUREMENT;

OPTICAL HETERODYNE PROFILOMETERS;

PROFILOMETRY;

EID: 0036535047 PISSN: 00304018 EISSN: None Source Type: Journal
DOI: 10.1016/S0030-4018(02)01212-9 Document Type: Article

Times cited : (6)

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