Impact of near-surface defects and morphology on ZnO luminescence

Applied Physics Letters

Volumn 94, Issue 4, 2009, Pages

  Doutt, D ^a   Mosbacker, H L ^a   Cantwell, G ^b   Zhang, J ^b   Song, J J ^b   Brillson, L J ^c  

^a OHIO STATE UNIVERSITY   (United States)

^b ZN Technology Inc   (United States)

^c Ohio State University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CRYSTAL DEFECTS; DEFECTS; EMISSION SPECTROSCOPY; LIGHT EMISSION; LUMINESCENCE; OPTICAL CORRELATION; SEMICONDUCTING ZINC COMPOUNDS; SURFACE DEFECTS; SURFACE ROUGHNESS; ZINC OXIDE;

AFM; ATOMIC FORCES; CATHODOLUMINESCENCE SPECTROSCOPIES; DEEP-LEVEL DEFECTS; DEFECT DISTRIBUTIONS; DEPTH-RESOLVED; FIGURE OF MERITS; GROWTH METHODS; KELVIN PROBES; NANO-METER SCALE; NANO-SCALE SUBSURFACE REGIONS; NEAR-SURFACE DEFECTS; OPTICAL EMISSIONS; STRONG CORRELATIONS; VAPOR-PHASE TRANSPORTS; ZNO; ZNO CRYSTALS;

SURFACE MORPHOLOGY;

EID: 59349100042     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3077015     Document Type: Article

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