-
1
-
-
17644401701
-
Deformation analysis of lap-shear testing of solder joints
-
Shen Y.-L., Chawla N., Ege E.S., and Deng X. Deformation analysis of lap-shear testing of solder joints. Acta Mater 53 (2005) 2633-2642
-
(2005)
Acta Mater
, vol.53
, pp. 2633-2642
-
-
Shen, Y.-L.1
Chawla, N.2
Ege, E.S.3
Deng, X.4
-
2
-
-
33845263626
-
Shear strength and interfacial microstructure of Sn-Ag-xNi/Cu single shear lap solder joints
-
Lee Y.-H., and Lee H.-T. Shear strength and interfacial microstructure of Sn-Ag-xNi/Cu single shear lap solder joints. Mater Sci Eng A 444 (2007) 75-83
-
(2007)
Mater Sci Eng A
, vol.444
, pp. 75-83
-
-
Lee, Y.-H.1
Lee, H.-T.2
-
3
-
-
27144446762
-
Reliability of Sn-Ag-Sb lead-free solder joints
-
Lee H.-T., Lin H.-S., Lee C.-S., and Chena P.-W. Reliability of Sn-Ag-Sb lead-free solder joints. Mater Sci Eng, A 407 (2005) 36-44
-
(2005)
Mater Sci Eng, A
, vol.407
, pp. 36-44
-
-
Lee, H.-T.1
Lin, H.-S.2
Lee, C.-S.3
Chena, P.-W.4
-
4
-
-
33645535327
-
Mechanical and microstructural properties of SnAgCu solder joints
-
Sundelin J.J., Nurmib S.T., Lepistö T.K., and Ristolainen E.O. Mechanical and microstructural properties of SnAgCu solder joints. Mater Sci Eng, A 420 (2006) 55-62
-
(2006)
Mater Sci Eng, A
, vol.420
, pp. 55-62
-
-
Sundelin, J.J.1
Nurmib, S.T.2
Lepistö, T.K.3
Ristolainen, E.O.4
-
5
-
-
34548665734
-
Reliability assessment for solders with a stress buffer layer using ball shear strength test and board-level finite element analysis
-
Yew M.-C., Chou C.-Y., and Chiang K.-N. Reliability assessment for solders with a stress buffer layer using ball shear strength test and board-level finite element analysis. Microelectron Reliab 47 (2007) 1658-1662
-
(2007)
Microelectron Reliab
, vol.47
, pp. 1658-1662
-
-
Yew, M.-C.1
Chou, C.-Y.2
Chiang, K.-N.3
-
6
-
-
0037463944
-
Effects of intermetallic compounds on properties of Sn-Ag-Cu lead-free soldered joints
-
Kima K.S., Huha S.H., and Suganumab K. Effects of intermetallic compounds on properties of Sn-Ag-Cu lead-free soldered joints. J Alloy Compd 352 (2003) 226-236
-
(2003)
J Alloy Compd
, vol.352
, pp. 226-236
-
-
Kima, K.S.1
Huha, S.H.2
Suganumab, K.3
-
7
-
-
33645135794
-
Isothermal aging effects on the microstructure and solder bump shear strength of eutectic Sn37Pb and Sn3.5Ag solders
-
Chen W.-M., McCloskey P., and O'Mathuna S.C. Isothermal aging effects on the microstructure and solder bump shear strength of eutectic Sn37Pb and Sn3.5Ag solders. Microelectron Reliab 46 (2006) 896-904
-
(2006)
Microelectron Reliab
, vol.46
, pp. 896-904
-
-
Chen, W.-M.1
McCloskey, P.2
O'Mathuna, S.C.3
-
8
-
-
16544377116
-
Experimental and finite element analysis of the shear speed effects on the Sn-Ag and Sn-Ag-Cu BGA solder joints
-
Kim J.-W., and Jung S.-B. Experimental and finite element analysis of the shear speed effects on the Sn-Ag and Sn-Ag-Cu BGA solder joints. Mater Sci Eng, A 371 (2004) 267-276
-
(2004)
Mater Sci Eng, A
, vol.371
, pp. 267-276
-
-
Kim, J.-W.1
Jung, S.-B.2
-
9
-
-
74449087759
-
-
DIN EN 60068-2-21: 1999-10 standard, pp. 16.
-
DIN EN 60068-2-21: 1999-10 standard, pp. 16.
-
-
-
-
10
-
-
0037463944
-
Effects of intermetallic compounds on properties of Sn-Ag-Cu lead-free soldered joints
-
Kim K.S., Huh S.H., and Suganuma K. Effects of intermetallic compounds on properties of Sn-Ag-Cu lead-free soldered joints. J Alloy Compd 352 (2003) 226-236
-
(2003)
J Alloy Compd
, vol.352
, pp. 226-236
-
-
Kim, K.S.1
Huh, S.H.2
Suganuma, K.3
-
11
-
-
0035364343
-
The effect of power cycling on the reliability of lead-free surface mount assemblies
-
Davitt E., Stam F.A., and Barrett J. The effect of power cycling on the reliability of lead-free surface mount assemblies. IEEE Trans Comp Packag Technol 24 2 (2001) 241-249
-
(2001)
IEEE Trans Comp Packag Technol
, vol.24
, Issue.2
, pp. 241-249
-
-
Davitt, E.1
Stam, F.A.2
Barrett, J.3
-
12
-
-
0034318047
-
Residual shear strength of Sn-Ag and Sn-Bi lead-free SMT joints after thermal shock
-
Poon N.M., Lawrence Wu C.M., Lai J.K.L., and Chan Y.C. Residual shear strength of Sn-Ag and Sn-Bi lead-free SMT joints after thermal shock. IEEE Trans Adv Packag 23 4 (2000) 708-714
-
(2000)
IEEE Trans Adv Packag
, vol.23
, Issue.4
, pp. 708-714
-
-
Poon, N.M.1
Lawrence Wu, C.M.2
Lai, J.K.L.3
Chan, Y.C.4
-
13
-
-
0035501302
-
Effects of thermomechanical cycling on lead and lead-free (SnPb and SnAgCu) surface mount solder joints
-
Stam F.A., and Davitt E. Effects of thermomechanical cycling on lead and lead-free (SnPb and SnAgCu) surface mount solder joints. Microelectron Reliab 41 (2001) 1815-1822
-
(2001)
Microelectron Reliab
, vol.41
, pp. 1815-1822
-
-
Stam, F.A.1
Davitt, E.2
-
15
-
-
0025492251
-
Dynamic behavior of SMT chip capacitors during solder reflow
-
Ellis R., and Masada Y. Dynamic behavior of SMT chip capacitors during solder reflow. IEEE Trans Comp, Hybrids, Manuf Technol 13 3 (1990) 545-552
-
(1990)
IEEE Trans Comp, Hybrids, Manuf Technol
, vol.13
, Issue.3
, pp. 545-552
-
-
Ellis, R.1
Masada, Y.2
-
17
-
-
0027148839
-
Determination of equilibrium shapes and optimal volume of solder droplets in the assembly of surface mounted integrated circuits
-
Racz L.M., and Szekely J. Determination of equilibrium shapes and optimal volume of solder droplets in the assembly of surface mounted integrated circuits. ISIJ Int 33 2 (1993) 336-342
-
(1993)
ISIJ Int
, vol.33
, Issue.2
, pp. 336-342
-
-
Racz, L.M.1
Szekely, J.2
-
18
-
-
0027611025
-
Finite element method for predicting equilibrium shapes of solder joints
-
Nigro N.J., Heinrich S.M., Elkouh A.F., Zou X., Fournelle R., and Lee P.S. Finite element method for predicting equilibrium shapes of solder joints. Trans ASME - J Electron Packag 115 June (1993) 141-146
-
(1993)
Trans ASME - J Electron Packag
, vol.115
, Issue.June
, pp. 141-146
-
-
Nigro, N.J.1
Heinrich, S.M.2
Elkouh, A.F.3
Zou, X.4
Fournelle, R.5
Lee, P.S.6
-
19
-
-
0034171999
-
An integrated system for prediction and analysis of solder interconnection shapes
-
Xiujuan Z., Chunqing W., Guozhong W., Guanqun Z., and Shiqin Y. An integrated system for prediction and analysis of solder interconnection shapes. IEEE Trans Electron Packag Manuf 23 2 (2000) 87-92
-
(2000)
IEEE Trans Electron Packag Manuf
, vol.23
, Issue.2
, pp. 87-92
-
-
Xiujuan, Z.1
Chunqing, W.2
Guozhong, W.3
Guanqun, Z.4
Shiqin, Y.5
-
20
-
-
0004097997
-
-
Noordhoff International Publishing, Leyden p. 96-124 (ISBN 90 286 0193 7)
-
Leipholz H. Theory of elasticity (1974), Noordhoff International Publishing, Leyden p. 96-124 (ISBN 90 286 0193 7)
-
(1974)
Theory of elasticity
-
-
Leipholz, H.1
-
21
-
-
51249164034
-
Microstructure and mechanical properties of Pb free solder alloys for low-cost electronic assembly: a review
-
Glazer J. Microstructure and mechanical properties of Pb free solder alloys for low-cost electronic assembly: a review. J Electron Mater 23 8 (1994) 693
-
(1994)
J Electron Mater
, vol.23
, Issue.8
, pp. 693
-
-
Glazer, J.1
-
22
-
-
70349687957
-
Crack growth analysis of lead free passive component assemblies
-
Leuven, Belgium, p
-
Limaye P, Lambrinou K, Vandevelde B, Vandepitte D, Verlinden B, Allaert B, et al. Crack growth analysis of lead free passive component assemblies, in: Conference proceedings surface mount technology association international, SMTA2006, September 2006, Leuven, Belgium, p. 774-82.
-
(2006)
Conference proceedings surface mount technology association international, SMTA2006, September
, pp. 774-782
-
-
Limaye, P.1
Lambrinou, K.2
Vandevelde, B.3
Vandepitte, D.4
Verlinden, B.5
Allaert, B.6
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