Reflectance of surfactant-templated mesoporous silica thin films: Simulations versus experiments

Thin Solid Films

Volumn 518, Issue 8, 2010, Pages 2134-2140

  Hutchinson, Neal J ^a   Coquil, Thomas ^a   Richman, Erik K ^b   Tolbert, Sarah H ^b   Pilon, Laurent ^a  

^a Engineering IV   (United States)

^b UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

Effective medium approximation; Mesoporous; Nanocomposite; Nanophotonics; Optical properties; Photocatalysis

Indexed keywords

AB INITIO; AMORPHOUS SILICA; CYLINDRICAL PORES; EFFECTIVE MEDIUM APPROXIMATION; EVAPORATION-INDUCED SELF-ASSEMBLY; HEXAGONAL MESOPOROUS SILICA; LATTICE PARAMETERS; LIQUID WATER; MATRIX; MAXWELL'S EQUATIONS; MESOPOROUS; MESOPOROUS SILICA THIN FILMS; MIXING RULES; NANOCOMPOSITE MATERIALS; REFLECTANCE MEASUREMENTS; SILICA MATRIX; SIMULATION TOOL; SPECTRAL REFLECTANCES; TEMPLATED MESOPOROUS SILICAS;

AMORPHOUS FILMS; CALCINATION; HYDRATES; HYDRATION; MAXWELL EQUATIONS; MESOPOROUS MATERIALS; NANOCOMPOSITES; NANOPHOTONICS; OPTICAL PROPERTIES; OXIDES; PHOTOCATALYSIS; PHOTONICS; REFLECTION; SILICA; SURFACE ACTIVE AGENTS; THIN FILMS;

FUSED SILICA;

EID: 73949113948     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2009.08.006     Document Type: Article

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