Scattering and reflective properties of ordered mesoporous silica films

Applied Optics

Volumn 44, Issue 21, 2005, Pages 4538-4546

  Sterligov, Valeriy A ^a,b  

^a UNIVERSITÉ CÔTE D'AZUR   (France)

^b INSTITUTE OF SEMICONDUCTOR PHYSICS   (Ukraine)

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC MATERIALS; LIGHT SCATTERING; MESOPOROUS MATERIALS; OPTIMIZATION; PROBLEM SOLVING; SCANNING ELECTRON MICROSCOPY; SILICA; SILICON WAFERS;

ANGULAR DISTRIBUTIONS; HEMISPHERICAL ELASTIC LIGHT SCATTERING (HELS); MESOPOROUS FILMS; SCATTERED BEAMS;

THIN FILMS;

EID: 23344451063     PISSN: 1559128X     EISSN: 15394522     Source Type: Journal    
DOI: 10.1364/AO.44.004538     Document Type: Article

References (31)

1. J. S. Beck, J. C. Vartuli, W. J. Roth, M. E. Leonowicz, C. T. Kresge, K D. Schmitt, C. T. W. Chu, D. H. Olson, E. W. Sheppard, S. B. McGullen, J. B. Higgins, and J. L. Schlenk, "A new family of mesoporous molecular sieves prepared with liquid crystal templates," J. Am. Chem. Soc. 114, 10834-10843 (1992).
2. Y. Lu, R. Ganguli, C. A. Drewien, M. T. Anderson, C. J. Brinker, W. Gong, Y. Guo, H. Soyez, B. Dunn, M. H. Huang, and J. I. Zink, "Continuous formation of supported cubic and hexagonal mesoporous films by sol-gel dip-coating," Nature 389, 364-368 (1997).
3. M. Klotz, A. Ayral, C. Guizard, and L. Cot, "Synthesis conditions for hexagonal mesoporous silica layers," J. Mater. Chem. 10, 663-669 (2000).
4. M. Klotz, P.-A. Albouy, A. Ayral, C. Ménager, D. Grosso, A. Van der Lee, V. Cabuil, F. Babonneau, and C. Guizard, "The true structure of hexagonal mesophase templated silica films as revealed by X-ray scattering: effects of thermal treatment and of nanoparticle seeding," Chem. Mater. 12, 1721-1728 (2000).
5. H. Fan, H. R. Bentley, K. R. Kathan, P. Clem, Y. Lu, and C. J. Brinker, "Self-assembled aerogel-like low dielectric constant films," J. Non-Cryst. Solids 285, 79-83 (2001).
6. C.-M. Yang, A.-T. Cho, F.-M. Pan, T.-G. Tsai, and K.-J. Chao, "Spin-on mesoporous silica films with ultralow dielectric constants, ordered pore structures, and hydrophobic surfaces," Adv. Mater. 13, 1099-1102 (2001).
7. G. Wirnsberger, B. J. Scott, and G. D. Stucky, "pH sensing with mesoporous thin films," Chem. Commun. 10, 119-120 (2001).
8. G. Wirnsberger, P. Yang, B. J. Scott, B. F. Chmelka, and G. D. Stucky, "Mesostructured materials for optical applications: from low-k dielectrics to sensors and lasers," Spectrochim. Acta A 57, 2049-2060 (2001).
9. B. J. Scott, G. Wirnsberger, and G. D. Stucky, "Mesoporous and mesostructured materials for optical applications," Chem. Mater. 13, 3140-3150 (2001).
10. V. Dufaud and M. E. Davis, "Design of heterogeneous catalysts via multiple active site positioning in organic-inorganic hybrid materials," J. Am. Chem. Soc. 125, 9403-9413 (2003).
11. E. Rodriguez-Castellon, A. Jimenez-Lopez, P. Maireles-Torres, D. J. Jones, J. Roziere, M. Trombetta, G. Busca, M. Lenarda, and L. Storaro, "Textural and structural properties and surface acidity characterization of mesoporous silica-zirconia molecular sieves," J. Solid State Chem. 175, 159-169 (2003).
12. S. Besson, T. Gacoin, C. Jacquiod, C. Ricolleau, D. Babonneau, and J.-P. Boilot, "Structural study of Su-hexagonal mesoporous spin-coated sol-gel films," J. Mater. Chem. 10, 1331-1336 (2000).
13. S. Besson, C. Ricolleau, T. Gacoin, C. Jacquiod, and J.-P. Boilot, "A new 3D organization of mesopores in oriented CTAB silica films," J. Phys. Chem. B 104, 12095-12097 (2000).
14. M. Klotz, S. Besson, C. Ricolleau, F. Bosc, and A. Ayral, "Ordered 3D hexagonal mesoporous silica membranes: synthesis and characterization," Mat. Res. Soc. Symp. Proc. 752, AA8.6.1 (2003).
15. S. Besson, T. Gacoin, C. Ricolleau, C. Jacquiod, and J.-P. Boilot, "3D quantum dot lattice inside mesoporous silica films," Nanoletters 2, 409-414 (2002).
16. R. Kofman, P. Cheyssac, and J. Richard, "Optical properties of Ga monocrystal in the 0.3-5-eV range," Phys. Rev. B 16, 5216-5224 (1977).
17. D. A. Minkov, "Calculation of the optical constants of a thin layer upon a transparent substrate from the reflection spectrum," J. Phys. D: Appl. Phys. 22, 1157-1161 (1989).
18. D. A. Minkov, "Method for determining the optical constants of a thin film on a transparent substrate," J. Phys. D: Appl. Phys. 22, 199-205 (1989).
19. K. A. Epstein, D. K. Misemer, and G. D. Vernstrom, "Optical parameters of absorbing semiconductors from transmission and reflection," Appl. Opt. 26, 294-299 (1987).
20. R. Rusli and G. A. J. Amaratunga, "Determination of the optical constants and thickness of thin films on slightly absorbing substrates," Appl. Opt. 34, 7914-7924 (1995).
21. J. M. González-Leal, E. Márquez, A. M. Bernal-Oliva, J. J. Ruiz-Pérez, and R. Jiménez-Garay, "Derivation of the optical constants of thermally-evaporated uniform films of binary chalcogenide glasses using only their reflection spectra," Thin Solid Films 317, 223-227 (1998).
22. J. Müllerová and J. Mudro, "Determination of optical parameters and thickness of thin films deposited on absorbing substrates using their reflection spectra," Acta Phys. Slov. 50, 477-488 (2000).
23. D. Palik, ed., Handbook of Optical Constants of Solids (Academic, New York, 1985).
24. V. A. Sterligov and P. Cheyssac, "Appareil et procédé de caractérisation optique d'un objet," patent CNRS FR2832795, G01B-011/30 (23 November 2001).
25. 2 films: relationship between LO mode frequency and porosity," Thin Solid Films 377-378, 57-61 (2000).
26. D. Grosso, A. R. Balkenende, P. A. Albouy, M. Lavergne, L. Mazerolles, and F. Babonneau, "Highly oriented 3D-hexagonal silica thin films produced with cetyltrimethylammonium bromide," J. Mater. Chem. 10, 2085-2089 (2000).
27. S. Besson, "Organized mesoporous silica films: synthesis, characterization of the structure and application to the growth of nanoparticles," Ph.D. thesis (Ecole Polytechnique, Paris, 2002) (in French).
28. A. Brunet-Bruneau, S. Besson, T. Gacoin, J. P. Boilot, and J. Rivory, "Reactivity of 3D hexagonal mesoporous silica films to environment studied by infrared ellipsometry," Thin Solid Films 447-448, 51-55 (2004).
29. P. Roche, E. Pelletier, and G. Albrand, "Antiscattering transparent monolayers: theory and experiment," J. Opt. Soc. Am. A 1, 1032-1033 (1984).
30. C. Amra, G. Albrand, and P. Roche, "Theory and application of antiscattering single layers: antiscattering antireflection coatings," Appl. Opt. 16, 2695-2702 (1986).
31. H. Giovannini and C. Amra, "Scattering-reduction effect with overcoated rough surfaces: theory and experiment," Appl. Opt. 36, 5574-5579 (1997).