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Volumn 80, Issue 12, 2009, Pages

High energy x-ray diffraction/x-ray fluorescence spectroscopy for high-throughput analysis of composition spread thin films

(5) Gregoire, John M a Dale, Darren b Kazimirov, Alexander b Disalvo, Francis J b Van Dover, R Bruce b

a School of Chemical and Molecular Engineering (United States)

b Department of Molecular Biology and Genetics (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BRAGG REFLECTION; COMBINATORIAL STUDIES; COMPOSITION-SPREAD THIN FILMS; DIFFRACTION IMAGES; DIFFRACTION PROFILES; DIFFRACTION TECHNIQUES; FIBER TEXTURE; FLUORESCENCE SPECTRA; HIGH ENERGY X-RAYS; HIGH THROUGHPUT; HIGH-THROUGHPUT ANALYSIS; HIGH-THROUGHPUT CRYSTALLOGRAPHY; MATERIALS RESEARCH; NON-INTERACTIVE; POWDER PATTERNS; RAPID ASSESSMENT; SIMULTANEOUS ACQUISITION; STRUCTURE PROPERTY RELATIONSHIPS; TEXTURED FILMS; X-RAY SOURCES;

DATA PROCESSING; DIFFRACTION; FLUORESCENCE; FLUORESCENCE SPECTROSCOPY; THIN FILM DEVICES; THIN FILMS; X RAY CRYSTALLOGRAPHY;

STRUCTURE (COMPOSITION);

ARTICLE; IMAGE PROCESSING; INSTRUMENTATION; METHODOLOGY; SPECTROFLUOROMETRY; X RAY; X RAY DIFFRACTION;

IMAGE PROCESSING, COMPUTER-ASSISTED; SPECTROMETRY, FLUORESCENCE; X-RAY DIFFRACTION; X-RAYS;

EID: 73849128778 PISSN: 00346748 EISSN: None Source Type: Journal
DOI: 10.1063/1.3274179 Document Type: Article

Times cited : (43)

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