Composition characterization of combinatorial materials by scanning X-ray fluorescence microscopy using microfocused synchrotron X-ray beam

Applied Surface Science

Volumn 223, Issue 1-3, 2004, Pages 214-219

  Vogt, Stefan ^a   Chu, Yong S ^a   Tkachuk, Andrei ^a   Ilinski, Petr ^a   Walko, Donald A ^a   Tsui, Frank ^b  

^a ARGONNE NATIONAL LABORATORY   (United States)

^b UNIVERSITY OF NORTH CAROLINA   (United States)

Author keywords

CoMnGe; Composition spread; Synchrotron radiation instrumentation; X ray diffraction; X ray fluorescence

Indexed keywords

COBALT COMPOUNDS; COMPOSITION; CRYSTAL STRUCTURE; OPTIMIZATION; PHOTONS; SYNCHROTRON RADIATION; TERNARY SYSTEMS; THROUGHPUT; X RAY DIFFRACTION;

ELECTRONIC LEVELS; X-RAY FLUORESCENCE (XRF);

THIN FILMS;

EID: 0345759562     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(03)00895-X     Document Type: Article

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